학술논문
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A 22 nm, 1540 TOP/s/W, 12.1 TOP/s/mm2 in-Memory Analog Matrix-Vector-Multiplier for DNN Acceleration
Conference
Papistas, I. A.; Cosemans, Stefan; Rooseleer, Bram; Doevenspeck, Jonas; Na, M.-H.; Mallik, Arindam; Debacker, Peter; Verkest, Diederik
2021 IEEE Custom Integrated Circuits Conference (CICC) Custom Integrated Circuits Conference (CICC), 2021 IEEE. :1-2 Apr, 2021
Conference
Loubet, N.; Hook, T.; Montanini, P.; Yeung, C.-W.; Kanakasabapathy, S.; Guillom, M.; Yamashita, T.; Zhang, J.; Miao, X.; Wang, J.; Young, A.; Chao, R.; Kang, M.; Liu, Z.; Fan, S.; Hamieh, B.; Sieg, S.; Mignot, Y.; Xu, W.; Seo, S.-C.; Yoo, J.; Mochizuki, S.; Sankarapandian, M.; Kwon, O.; Carr, A.; Greene, A.; Park, Y.; Frougier, J.; Galatage, R.; Bao, R.; Shearer, J.; Conti, R.; Song, H.; Lee, D.; Kong, D.; Xu, Y.; Arceo, A.; Bi, Z.; Xu, P.; Muthinti, R.; Li, J.; Wong, R.; Brown, D.; Oldiges, P.; Robison, R.; Arnold, J.; Felix, N.; Skordas, S.; Gaudiello, J.; Standaert, T.; Jagannathan, H.; Corliss, D.; Na, M.-H.; Knorr, A.; Wu, T.; Gupta, D.; Lian, S.; Divakaruni, R.; Gow, T.; Labelle, C.; Lee, S.; Paruchuri, V.; Bu, H.; Khare, M.
2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T230-T231 Jun, 2017
Academic Journal
Salahuddin, S.M.; Litta, E.D.; Gupta, A.; Ritzenthaler, R.; Schaekers, M.; Everaert, J.-L.; Yu, H.; Vandooren, A.; Ryckaert, J.; Na, M.-H.; Spessot, A.
In: IEEE Transactions on Electron Devices . (IEEE Transactions on Electron Devices, November 2020, 67(11):4631-4635)
Academic Journal
In: Journal of Pediatric Orthopaedics Part B . (Journal of Pediatric Orthopaedics Part B, 1 September 2020, 29(5):452-457)
Academic Journal
Yuan, X.; Shimizu, T.; Mahalingam, U.; Brown, J. S.; Habib, K. Z.; Tekleab, D. G.; Su, T.-C.; Satadru, S.; Olsen, C. M.; Lee, H.; Pan, L.-H.; Hook, T. B.; Han, J.-P.; Park, J.-E.; Na, M.-H.; Rim, K.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 58(2):335-342 Feb, 2011
Conference
Yi, J.; Kim, M.; Seo, J.; Park, N.; Lee, S.; Kim, J.; Do, G.; Jang, H.; Koo, H.; Cho, S.; Chae, S.; Kim, T.; Na, M.-H.; Cha, S.
In: Digest of Technical Papers - Symposium on VLSI Technology , 2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023. (Digest of Technical Papers - Symposium on VLSI Technology, 2023, 2023-June)
Conference
In: Digest of Technical Papers - Symposium on VLSI Technology , 2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023. (Digest of Technical Papers - Symposium on VLSI Technology, 2023, 2023-June)
Conference
Suh, D.I.; Koo, W.-T.; Kim, Y.; Kim, J.-Y.; Ryu, S.W.; Jeon, H.; Im, K.V.; Lee, G.; Youn, T.; Jeong, H.; Lee, S.; Na, M.-H.; Cha, S.Y.
In: 7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023 , 7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023. (7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023, 2023)
Conference
Krishnan, S.; Kwon, U.; Moumen, N.; Stoker, M.W.; Harley, E.C.T.; Bedell, S.; Nair, D.; Greene, B.; Henson, W.; Chowdhury, M.; Prakash, D.P.; Wu, E.; Ioannou, D.; Cartier, E.; Na, M.-H.; Inumiya, S.; Mcstay, K.; Edge, L.; Iijima, R.; Cai, J.; Frank, M.; Hargrove, M.; Guo, D.; Kerber, A.; Jagannathan, H.; Ando, T.; Shepard, J.; Siddiqui, S.; Dai, M.; Bu, H.; Schaeffer, J.; Jaeger, D.; Barla, K.; Wallner, T.; Uchimura, S.; Lee, Y.; Karve, G.; Zafar, S.; Schepis, D.; Wang, Y.; Donaton, R.; Saroop, S.; Montanini, P.; Liang, Y.; Stathis, J.; Carter, R.; Pal, R.; Paruchuri, V.; Yamasaki, H.; Lee, J-H.; Ostermayr, M.; Han, J-P.; Hu, Y.; Gribelyuk, M.; Park, D.-G.; Chen, X.; Samavedam, S.; Narasimha, S.; Agnello, P.; Khare, M.; Divakaruni, R.; Narayanan, V.; Chudzik, M.
2011 International Electron Devices Meeting Electron Devices Meeting (IEDM), 2011 IEEE International. :28.1.1-28.1.4 Dec, 2011
Conference
Seo, S.M.; Kim, S.G.; Ha, T.J.; Jung, B.K.; Jung, K.Y.; Moon, H.I.; Kim, B.S.; Kim, S.; Lee, S.-H.; Na, M.-H.; Cha, S.Y.; Aikawa, H.; Nagase, T.; Ito, Y.; Yoshino, K.; Oikawa, T.; Matsuoka, F.; Hatsuda, K.; Hoya, K.
In: Technical Digest - International Electron Devices Meeting, IEDM , 2022 International Electron Devices Meeting, IEDM 2022. (Technical Digest - International Electron Devices Meeting, IEDM, 2022, 2022-December:1011-1014)
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[AR] Na, M.-H.
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