학술논문
'학술논문'
에서 검색결과 17건 | 목록
1~10
Conference
Fenouillet-Beranger, C.; Brunet, L.; Batude, P.; Andrieu, F.; Micout, J.; Previtali, B.; Pedini, J-M.; Mazzocchi, V.; Acosta-Alba, P.; Kerdiles, S.; Beugin, V.; Guerin, C.; Vizioz, C.; Ponthenier, F.; Rambal, N.; Casse, M.; Garros, X.; Chevalliez, S.; Aussenac, F.; Vinet, M.
2019 Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2019. :249-251 Mar, 2019
Conference
Micout, J.; Rafhay, Q.; Garros, X.; Casse, M.; Coignus, J.; Pasini, L.; Lu, C.-M. V.; Rambal, N.; Fenouillet-Beranger, C.; Brunet, L.; Romano, G.; Gassilloud, R.; Batude, P.; Vinet, M.; Ghibaudo, G.
2017 47th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2017 47th European. :144-147 Sep, 2017
Conference
Fenouillet-Beranger, C.; Batude, P.; Brunet, L.; Mazzocchi, V.; Lu, C-M. V.; Deprat, F.; Micout, J.; Samson, M-P.; Previtali, B.; Besombes, P.; Rambal, N.; Andrieu, F.; Billoint, O.; Brocard, M.; Thuries, S.; Cibrario, G.; Vinet, M.
2016 International Conference on IC Design and Technology (ICICDT) IC Design and Technology (ICICDT), 2016 International Conference on. :1-4 Jun, 2016
Conference
Fenouillet-Beranger, C.; Batude, P.; Brunet, L.; Mazzocchi, V.; Lu, C-M.V.; Deprat, F.; Micout, J.; Samson, M-P.; Previtali, B.; Besombes, P.; Rambal, N.; Lapras, V.; Andrieu, F.; Billoint, O.; Brocard, M.; Thuries, S.; Cibrario, G.; Acosta-Alba, P.; Mathieu, B.; Kerdiles, S.; Nemouchi, F.; Arvet, C.; Besson, P.; Loup, V.; Gassilloud, R.; Garros, X.; Leroux, C.; Beugin, V.; Guerin, C.; Benoit, D.; Pasini, L.; Hartmann, J-M.; Vinet, M.
2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2016 IEEE. :1-3 Oct, 2016
Conference
Micout, J.; Sklenard, B.; Batude, P.; Berthelon, R.; Rafhay, Q.; Lacord, J.; Mathieu, B.; Pasini, L.; Saghi, Z.; Delaye, V.; Brunet, L.; Fenouillet-Beranger, C.; Joblot, S.; Mazen, F.; Mazzocchi, V.; Colinge, J-P.; Ghibaudo, G.; Vinet, M.
2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2017 IEEE. :1-2 Oct, 2017
Conference
Pasini, L.; Batude, P.; Lacord, J.; Casse, M.; Mathieu, B.; Sklenard, B.; Luce, F. Piegas; Micout, J.; Payet, A.; Mazen, F.; Besson, P.; Ghegin, E.; Borrel, J.; Daubriac, R.; Hutin, L.; Blachier, D.; Barge, D.; Chhun, S.; Mazzocchi, V.; Cros, A.; Barnes, J-P.; Saghi, Z.; Delaye, V.; Rambal, N.; Lapras, V.; Mazurier, J.; Weber, O.; Andrieu, F.; Brunet, L.; Fenouillet-Beranger, C.; Rafhay, Q.; Ghibaudo, G.; Cristiano, F.; Haond, M.; Boeuf, F.; Vinet, M.
2016 IEEE Symposium on VLSI Technology VLSI Technology, 2016 IEEE Symposium on. :1-2 Jun, 2016
Conference
Batude, P.; Brunet, L.; Fenouillet-Beranger, C.; Andrieu, F.; Colinge, J.-P.; Lattard, D.; Vianello, E.; Thuries, S.; Billoint, O.; Vivet, P.; Santos, C.; Mathieu, B.; Sklenard, B.; Lu, C.-M. V.; Micout, J.; Deprat, F.; Mercado, E. Avelar; Ponthenier, F.; Rambal, N.; Samson, M.-P.; Casse, M.; Hentz, S.; Arcamone, J.; Sicard, G.; Hutin, L.; Pasini, L.; Ayres, A.; Rozeau, O.; Berthelon, R.; Nemouchi, F.; Rodriguez, P.; Pin, J.-B.; Larmagnac, D.; Duboust, A.; Ripoche, V.; Barraud, S.; Allouti, N.; Barnola, S.; Vizioz, C.; Hartmann, J.-M.; Kerdiles, S.; Alba, P. Acosta; Beaurepaire, S.; Beugin, V.; Fournel, F.; Besson, P.; Loup, V.; Gassilloud, R.; Martin, F.; Garros, X.; Mazen, F.; Previtali, B.; Euvrard-Colnat, C.; Balan, V.; Comboroure, C.; Zussy, M.; Mazzocchi; Faynot, O.; Vinet, M.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :3.1.1-3.1.4 Dec, 2017
Conference
Micout, J.; Lapras, V.; Batude, P.; Fenouillet-Beranger, C.; Lacord, J.; Sklenard, B.; Mathieu, B.; Rafhay, Q.; Mazzocchi, V.; Colinge, J.-P.; Lachal, L.; Garros, X.; Casse, M.; Toffoli, A.; Romano, G.; Allain, F.; Brunet, L.; Hartmann, J.-M.; Bortolin, R.; Mazen, F.; Barraud, S.; Rambal, N.; Tabone, C.; Samson, M.-P.; Besombes, P.; Delaye, V.; Saghi, Z.; Loup, V.; Comboroure, C.; Balan, V.; Desvoivres, L.; Vizioz, C.; Ghibaudo, G.; Vinet, M.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :32.2.1-32.2.4 Dec, 2017
Conference
Micout, J.; Lapras, V.; Batude, P.; Fenouillet-Beranger, C.; Lacord, J.; Sklenard, B.; Mathieu, B.; Mazzocchi, V.; Colinge, J.-P.; Lachal, L.; Garros, X.; Casse, M.; Toffoli, A.; Allain, F.; Brunet, L.; Hartmann, J.-M.; Bortolin, R.; Mazen, F.; Barraud, S.; Rambal, N.; Tabone, C.; Besombes, P.; Delaye, V.; Saghi, Z.; Loup, V.; Comboroure, C.; Balan, V.; Desvoivres, L.; Vizioz, C.; Vinet, M.; Rafhay, Q.; Ghibaudo, G.; Romano, G.; Samson, M.-P.
In: Technical Digest - International Electron Devices Meeting, IEDM , 2017 IEEE International Electron Devices Meeting, IEDM 2017. (Technical Digest - International Electron Devices Meeting, IEDM, 23 January 2018, :32.2.1-32.2.4)
Conference
Batude, P.; Brunet, L.; Fenouillet-Beranger, C.; Andrieu, F.; Colinge, J.-P.; Lattard, D.; Vianello, E.; Thuries, S.; Billoint, O.; Vivet, P.; Santos, C.; Mathieu, B.; Sklenard, B.; Lu, C.-M.V.; Micout, J.; Deprat, F.; Mercado, E.A.; Ponthenier, F.; Rambal, N.; Cassé, M.; Hentz, S.; Arcamone, J.; Sicard, G.; Hutin, L.; Pasini, L.; Ayres, A.; Rozeau, O.; Berthelon, R.; Nemouchi, F.; Rodriguez, P.; Barraud, S.; Allouti, N.; Barnola, S.; Vizioz, C.; Hartmann, J.-M.; Kerdiles, S.; Alba, P.A.; Beaurepaire, S.; Beugin, V.; Fournel, F.; Loup, V.; Gassilloud, R.; Martin, F.; Garros, X.; Mazen, F.; Previtali, B.; Euvrard-Colnat, C.; Balan, V.; Comboroure, C.; Zussy, M.; Mazzocchi; Faynot, O.; Vinet, M.; Samson, M.-P.; Besson, P.; Pin, J.-B.; Larmagnac, D.; Duboust, A.; Ripoche, V.
In: Technical Digest - International Electron Devices Meeting, IEDM , 2017 IEEE International Electron Devices Meeting, IEDM 2017. (Technical Digest - International Electron Devices Meeting, IEDM, 23 January 2018, :3.1.1-3.1.4)
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[AR] Micout, J.
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