학술논문
'학술논문'
에서 검색결과 42건 | 목록
1~10
Conference
2006 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on. :173-178 2006
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 58(8):2235-2248 Aug, 2011
Academic Journal
Skotnicki, T.; Fenouillet-Beranger, C.; Gallon, C.; Boeuf, F.; Monfray, S.; Payet, F.; Pouydebasque, A.; Szczap, M.; Farcy, A.; Arnaud, F.; Clerc, S.; Sellier, M.; Cathignol, A.; Schoellkopf, J.-P.; Perea, E.; Ferrant, R.; Mingam, H.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 55(1):96-130 Jan, 2008
Conference
2008 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures, 2008. ICMTS 2008. IEEE International Conference on. :90-95 Mar, 2008
Conference
Fenouillet-Beranger, C.; Denorme, S.; Icard, B.; Boeuf, F.; Coignus, J.; Faynot, O.; Brevard, L.; Buj, C.; Soonekindt, C.; Todeschini, J.; Le-Denmat, J.C.; Loubet, N.; Gallon, C.; Perreau, P.; Manakli, S.; Minghetti, B.; Pain, L.; Arnal, V.; Vandooren, A.; Aime, D.; Tosti, L.; Savardi, C.; Broekaart, M.; Gouraud, P.; Leverd, F.; Dejonghe, V.; Brun, P.; Guillermet, M.; Aminpur, M.; Barnola, S.; Rouppert, F.; Martin, F.; Salvetat, T.; Lhostis, S.; Laviron, C.; Auriac, N.; Kormann, T.; Chabanne, G.; Gaillard, S.; Belmont, O.; Laffosse, E.; Barge, D.; Zauner, A.; Tarnowka, A.; Romanjec, K.; Brut, H.; Lagha, A.; Bonnetier, S.; Joly, F.; Mayet, N.; Cathignol, A.; Galpin, D.; Pop, D.; Delsol, R.; Pantel, R.; Pionnier, F.; Thomas, G.; Bensahel, D.; Deleonibus, S.; Skotnicki, T.; Mingam, H.
2007 IEEE International Electron Devices Meeting Electron Devices Meeting, 2007. IEDM 2007. IEEE International. :267-270 Dec, 2007
Conference
2007 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures, 2007. ICMTS '07. IEEE International Conference on. :230-233 Mar, 2007
Academic Journal
Asenov, A.; Cathignol, A.; Cheng, B.; McKenna, K. P.; Brown, A. R.; Shluger, A. L.; Chanemougame, D.; Rochereau, K.; Ghibaudo, G.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 29(8):913-915 Aug, 2008
Quantitative Evaluation of Statistical Variability Sources in a 45-nm Technological Node LP N-MOSFET
Academic Journal
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 29(6):609-611 Jun, 2008
Conference
Cathignol, A.; Cros, A.; Harrison, S.; Cerrutti, R.; Coronel, P.; Pouydebasque, A.; Rochereau, K.; Skotnicki, T.; Ghibaudo, G.
2006 European Solid-State Device Research Conference Solid-State Device Research Conference, 2006. ESSDERC 2006. Proceeding of the 36th European. :379-382 Sep, 2006
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 58(4):1255-1256 Apr, 2011
검색 결과 제한하기
제한된 항목
[AR] Cathignol, A.
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