학술논문
'학술논문'
에서 검색결과 219건 | 목록
1~10
Conference
Tan, S. S.; Fang, S.; Yuan, J.; Zhao, L.; Lee, Y. M.; Kim, J. J.; Robinson, R.; Yan, J.; Park, J.; Belyansky, M.; Li, J.; Stierstorfer, R.; Kim, S. D.; Rovedo, N.; Shang, H.; Ng, H.; Li, Y.; Sudijono, J.; Quek, E.; Chu, S.; Divakaruni, R.; Iyer, S.
2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) VLSI Technology, Systems and Applications, 2008. VLSI-TSA 2008. International Symposium on. :122-123 Apr, 2008
Conference
Ieong, M.; Sudijono, J.; Ku, J.H.; Shum, D.; Hierlemann, M.; Amos, R.; Chiulli, G.; Lindsay, R.; Kim, S.D.; Loesing, R.; Burns, L.; Turansky, A.; Madan, A.; St Lawrence, B.; Davis, R.; Murphy, R.; Li, J.; Kim, J.J.; Zhuang, H.; Mishra, S.; Schepis, D.; Gutmann, A.; Kempisty, J.; Adam, T.N.; Holt, J.; Ng, H.; Fang, S.; Chong, Y.F.; Stierstorfer, R.; Krishnasamy, R.; Luo, Z.; Rovedo, N.; Teo, L.W.; Utomo, H.; Han, J.P.
2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-4 Dec, 2006
Conference
Luo, Z.; Rovedo, N.; Ong, S.; Phoong, B.; Eller, M.; Utomo, H.; Ryou, C.; Wang, H.; Stierstorfer, R.; Clevenger, L.; Kim, S.; Toomey, J.; Sciacca, D.; Li, J.; Wille, W.; Zhao, L.; Teo, L.; Dyer, T.; Fang, S.; Yan, J.; Kwon, O.; Park, D.; Holt, J.; Han, J.; Chan, V.; Yuan, J.; Kebede, T.; Lee, H.; Lee, S.; Vayshenker, A.; Yang, Z.; Tian, C.; Ng, H.; Shang, H.; Hierlemann, M.; Ku, J.; Sudijono, J.; Ieong, M.
2007 IEEE Symposium on VLSI Technology VLSI Technology, 2007 IEEE Symposium on. :16-17 Jun, 2007
Conference
Davis, C.; Ku, J.H.; Schiml, T.; Sudijono, J.; Yang, I.; Steegen, A.; Coolbough, D.; Hierlemann, M.; Ng, H.; Amos, R.; Sherony, M.; Belyansky, M.; Widodo, J.; Tjoa, T.; Edleman, N.; Kwon, O.; Panda, S.; Yuan, J.; Nguyen, P.; Nivo, N.; Luo, Z.; Chidambarrao, D.; Stierstorfer, R.; Kim, J.; Park, J.; Ajmera, A.; Baiocco, C.; Ko, Y.; Tan, S.S.; Teh, Y.W.; Dyer, T.; Gao, W.; Fang, S.; Chen, X.
2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers. VLSI Technology, 2006. Digest of Technical Papers. 2006 Symposium on. :60-61 2006
Conference
Yuan, J.; Tan, S.; Lee, Y.; Kim, J.; Lindsay, R.; Sardesai, V.; Hook, T.; Amos, R.; Luo, Z.; Lee, W.; Fang, S.; Dyer, T.; Rovedo, N.; Stierstorfer, R.; Yang, Z.; Li, J.; Barton, K.; Ng, H.; Sudijono, J.; Ku, J.; Hierlemann, M.; Schiml, T.
2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers. VLSI Technology, 2006. Digest of Technical Papers. 2006 Symposium on. :100-101 2006
Conference
Weiss, I.; Altevogt, J.; Klessmann, C.; Helm, P.; Gisler, R.; Stierstorfer, J.; Orthen, S.; Beutin, P.; Juquois, F.; Silva, L.; Veigl, A.; Nemac, F.; Fresneda, A.; Protogeropoulos, C.; Swens, J.; Viaud, M.; Despotou, E.
2006 IEEE 4th World Conference on Photovoltaic Energy Conference Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on. 2:2497-2499 May, 2006
Academic Journal
Oertel, Wolfgang H.; Hallström, Yngve; Saletu-Zyhlarz, Gerda M.; Hopp, Michael; Bosse, Björn; Trenkwalder, Claudia; Högl, B.; Röper, C.; Saletu-Zyhlarz, G.; Behrens, S.; Beneš, H.; Bergtholdt, B.; Bitter, R.; Bodenschatz, R.; Böhringer, J.; Boldt, H.-J.; Braune, S.; Donat, P.; Fietze, I.; Franz, P.; Geisler, P.; Gertz, H.-J.; Gestewitz, B.; Haan, J.; Happe, S.; Henin, H.; Hornyak, M.; Hufnagel, A.; Kallmann, B.-A.; Karlbauer, G.; Kassubek, J.; Klein, M.; Koppai-Reiner, J.; Lang, M.; Leibinger, R.; Lüer, W.; Lünser, W.; Mahler, A.; Mattern, W.; Mayer, G.; Molt, W.; Oertel, W.; Peglau, I.; Peltz, J.; Rüttgers, E.; Sallach, K.; Schöll, I.; Schulze, A.; Schumann, V.; Siefjediers, V.; Siever, A.; Sigel, K.-O.; Simonow, A.; Sixel-Döring, F.; Sloksnat, R.; Sommer, H.; Springub, J.; Spieker, T.; Steinwachs, K.-C.; Stiasny-Kolster, K.; Stierstorfer, A.; Storch, A.; Tinschert, K.; Trenkwalder, C.; Veit, B.; Warmuth, R.; Young, P.; Zuchner, D.; García-Borreguero, D.; Iranzo de Riquer, A.; Martinez Rodriguez, J. E.; Puertas, F. J.; Romero Santo-Tomás, O.; Grote, L.; Hallström, Y.; Markström, A.; For the RELOXYN Study Group
CNS Drugs. August 2016 30(8):749-760
Academic Journal
Düchs M; Boehringer Ingelheim Pharma GmbH & Co KG, Biberach an der Riss, Germany.; Blazevic D; Boehringer Ingelheim Pharma GmbH & Co KG, Biberach an der Riss, Germany.; Rechtsteiner P; Boehringer Ingelheim Pharma GmbH & Co KG, Biberach an der Riss, Germany.; Kenny C; Boehringer Ingelheim USA, Ridgefield, CT, USA.; Lamla T; Boehringer Ingelheim Pharma GmbH & Co KG, Biberach an der Riss, Germany.; Low S; Boehringer Ingelheim USA, Ridgefield, CT, USA.; Savistchenko J; Institut Francois Jacob (MIRCen), CEA, CNRS, Fontenay-aux-Roses, France.; Neumann M; Molecular Neuropathology of Neurodegenerative Diseases, German Center for Neurodegenerative Diseases, Tübingen, Germany.; Department of Neuropathology, University Hospital of Tübingen, Tübingen, Germany.; Melki R; Institut Francois Jacob (MIRCen), CEA, CNRS, Fontenay-aux-Roses, France.; Schönberger T; Boehringer Ingelheim Pharma GmbH & Co KG, Biberach an der Riss, Germany.; Stierstorfer B; Boehringer Ingelheim Pharma GmbH & Co KG, Biberach an der Riss, Germany.; Wyatt D; Boehringer Ingelheim Pharma GmbH & Co KG, Biberach an der Riss, Germany.; Igney F; Boehringer Ingelheim Pharma GmbH & Co KG, Biberach an der Riss, Germany.; Ciossek T; Boehringer Ingelheim Pharma GmbH & Co KG, Biberach an der Riss, Germany. thomas.ciossek@boehringer-ingelheim.com.
Publisher: Nature Publishing Group Country of Publication: United States NLM ID: 101675390 Publication Model: Electronic Cited Medium: Print ISSN: 2373-8057 (Print) Linking ISSN: 23738057 NLM ISO Abbreviation: NPJ Parkinsons Dis Subsets: PubMed not MEDLINE
Academic Journal
Monné Rodríguez JM; F. Hoffmann-La Roche Ltd, Basel, Switzerland.; University of Zurich, Zurich, Switzerland.; Frisk AL; Janssen Research & Development, Beerse, Belgium.; Kreutzer R; AnaPath Services GmbH, Liestal, Switzerland.; Lemarchand T; StageBio, Freiburg, Germany.; Lezmi S; Excilone Services, Jouy-en-Josas, France.; Saravanan C; Novartis Institutes for Biomedical Research, Cambridge, Massachusetts, USA.; Stierstorfer B; Boehringer Ingelheim Pharma GmbH & Co. KG, Biberach an der Riß, Germany.; Thuilliez C; NovaXia, Saint-Laurent-Nouan, France.; Vezzali E; Idorsia Pharmaceuticals Ltd, Allschwil, Switzerland.; Wieczorek G; Novartis Institutes for Biomedical Research, Basel, Switzerland.; Yun SW; Boehringer Ingelheim Pharma GmbH & Co. KG, Biberach an der Riß, Germany.; Schaudien D; Fraunhofer Institute for Toxicology and Experimental Medicine, Hannover, Germany.
Publisher: Sage Publications Country of Publication: United States NLM ID: 7905907 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1533-1601 (Electronic) Linking ISSN: 01926233 NLM ISO Abbreviation: Toxicol Pathol Subsets: MEDLINE
Academic Journal
Takeshita, Junko; Wang, Shuwei; Shin, Daniel B.; Callis Duffin, Kristina; Krueger, Gerald G.; Kalb, Robert E.; Weisman, Jamie D.; Sperber, Brian R.; Stierstorfer, Michael B.; Brod, Bruce A.; Schleicher, Stephen M.; Robertson, Andrew D.; Linn, Kristin A.; Shinohara, Russell T.; Troxel, Andrea B.; Van Voorhees, Abby S.; Gelfand, Joel M.
Journal of the American Academy of Dermatology. Dec 01, 2014 71(6):1167-1175
검색 결과 제한하기
제한된 항목
[검색어] Stierstorfer, R.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어