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Academic Journal
Gu, J.; Meng, N.; Loh, K.P.; Liu, Y.; Tjiptoharson, F.; Teo, S.L.; Zhu, Q.; Chen, Y.; Lin, M.; Dong, Z.; Sahmuganathan, V.; Tan, S.C.; Sudijono, J.; Tang, J.; Venkatasubramanian, E.; Mallick, A.; Rezaei, S.D.
In: Advanced Optical Materials . (Advanced Optical Materials, 17 March 2023, 11(6))
Academic Journal
Gu, J.; Lyu, J.; Chen, Z.; Xu, H.; Loh, K.P.; Sahmuganathan, V.; Tan, S.C.; Sudijono, J.; Tang, J.; Venkatasubramanian, E.; Mallick, A.; Yang, S.-W.; Teo, S.L.; Lin, M.
In: Diamond and Related Materials . (Diamond and Related Materials, December 2022, 130)
Academic Journal
Lim, K.Y.; Chan, V.; Rengarajan, R.; Lee, H.K.; Rovedo, N.; Lim, E.H.; Yang, S.; Jamin, F.; Nguyen, P.; Lin, W.; Lai, C.W.; Teh, Y.W.; Lee, J.; Kim, L.; Luo, Z.; Ng, H.; Sudijono, J.; Wann, C.; Yang, I.
In Solid State Electronics 2006 50(4):579-586
Academic Journal
In: Diamond and Related Materials . (Diamond and Related Materials, November 2021, 119)
Conference
Wu, Xusheng; Hu, Y.; Kusunoki, N.; Yang, Z. J.; Yang, G.; Teh, Y.; Kirshnan, R.; Krishnan, S.; Shepard, J.; Han, S.; Lee, Y.; Arnaud, F.; Sherony, M.; Sudijono, J.; Steegen, A.
2010 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) Electron Devices and Solid-State Circuits (EDSSC), 2010 IEEE International Conference of. :1-4 Dec, 2010
Conference
Yuan, J.; Gruensfelder, C.; Lim, K. Y.; Wallner, T.; Jung, M. K; Sherony, M. J.; Lee, Y. M.; Chen, J.; Lai, C. W.; Chow, Y.T.; Stein, K.; Song, L. Y.; Onoda, H.; An, C. W.; Wang, H.; Moon, B. K.; Kim, J.; Inokuma, H.; Yamasaki, H.; Shah, J.; Meer, H.V.; Samavedam, S. B.; Zhang, Q. T.; Zhu, C.; Park, Y.; Lim, Y. E.; Nieuwenhuizen, R.; Han, J. P.; Hamaguchi, M.; Lai, W.L.; Belyansky, M. P.; Gluschenkov, O.; Johnson, S.; Divakaruni, R.; Kaste, E. F.; Sudijono, J.; Ku, J. H.; Matsuoka, F.; Neumueller, W.; Sampson, R.; Sekine, M.; Steegen, A.
2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on. :66-69 Nov, 2010
Conference
Lim, K.Y.; Chan, V.; Rengarajan, R.; Lee, H.K.; Rovedo, N.; Lim, E.H.; Yang, S.; Jamin, F.; Nguyen, P.; Lin, W.; Lai, C.W.; Teh, Y.W.; Lee, J.; Kim, L.; Luo, Z.; Ng, H.; Sudijono, J.; Wann, C.; Yang, I.
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :415-418 2005
Conference
Luo, Z.; Steegen, A.; Eller, M.; Mann, R.; Baiocco, C.; Nguyen, P.; Kim, L.; Hoinkis, M.; Ku, V.; Klee, V.; Jamin, F.; Wrschka, P.; Shafer, P.; Lin, W.; Fang, S.; Ajmera, A.; Tan, W.; Park, D.; Mo, R.; Lian, J.; Vietzke, D.; Coppock, C.; Vayshenker, A.; Hook, T.; Chan, V.; Kim, K.; Cowley, A.; Kim, S.; Kaltalioglu, E.; Zhang, B.; Marokkey, S.; Lin, Y.; Lee, K.; Zhu, H.; Weybright, M.; Rengarajan, R.; Ku, J.; Schiml, T.; Sudijono, J.; Yang, I.; Wann, C.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :661-664 2004
Conference
2000 5th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.00TH8479) Plasma process-induced damage Plasma Process-Induced Damage, 2000 5th International Symposium on. :69-72 2000
Conference
1999 4th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.99TH8395) Plasma process-induced damage Plasma Process-Induced Damage, 1999 4th International Symposium on. :53-56 1999
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[AR] Sudijono, J.
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