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Low-Temperature Deuterium Annealing for High-Performance and Reliable Poly-Si Channel Thin-Film Transistors
Academic Journal
Kil, T.
;
Kim, J.
;
Ku, J.
;
Wang, D.
;
Jung, D.
;
Kang, M.
;
Park, J.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(2):1078-1083 Feb, 2024
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Physically Unclonable Function With a Rough Silicon Channel MOSFET
Academic Journal
Jung, D.
;
Yu, J.
;
Ku, J.
;
Yoon, S.
;
Kim, J.
;
Han, J.
;
Kil, T.
;
Wang, D.
;
Yeon, J.
;
Choi, Y.
;
Park, J.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(1):425-430 Jan, 2024
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Improved SOI FinFETs Performance With Low-Temperature Deuterium Annealing
Academic Journal
Ku, J.
;
Yu, J.
;
Wang, D.
;
Jung, D.
;
Han, J.
;
Choi, Y.
;
Park, J.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(7):3958-3962 Jul, 2023
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Comprehensive Study on Trap-Induced Bias Instability via High-Pressure D2 and N2 Annealing
Academic Journal
Ku, J.
;
Lee, K.
;
Jung, D.
;
Wang, D.
;
Oh, S.
;
Cho, B.
;
Bae, H.
;
Park, J.
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(2):276-280 Jun, 2023
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Low-Temperature Deuterium Annealing for the Recovery of Ionizing Radiation-Induced Damage in MOSFETs
Academic Journal
Wang, D.
;
Yoon, S.
;
Ku, J.
;
Jung, D.
;
Lee, K.
;
Kim, D.
;
Park, J.
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(2):297-301 Jun, 2023
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Meet the authors: Jayoung Ku, Keonyong Lee, and Yoosik Kim
Academic Journal
Ku, J.
;
Lee, K.
;
Kim, Y.
In:
Molecular cell
. (Molecular cell, 21 March 2024, 84(6):991-994)
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Alternative polyadenylation determines the functional landscape of inverted Alu repeats
Academic Journal
Ku, J.
;
Lee, K.
;
Ku, D.
;
Kim, S.
;
Kim, N.
;
Kim, Y.
;
Lee, J.
;
Bang, H.
;
Do, H.
;
Han, J.
;
Lee, H.
;
Lee, Y.-S.
;
Lim, C.
In:
Molecular Cell
. (Molecular Cell, 21 March 2024, 84(6):1062-1077.e9)
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A posteriori error estimates for a dual finite element method for singularly perturbed reaction–diffusion problems
Academic Journal
Ku, J.
;
Stynes, M.
In:
BIT Numerical Mathematics
. (BIT Numerical Mathematics, March 2024, 64(1))
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Construction of Fourier Transform Near Infrared Spectroscopy Prediction Model for Main Components in Lycium ruthenicum Murr
Academic Journal
Zhou, Z.
;
Heng, Y.
;
Ji, Z.
;
Mao, J.
;
Chen, C.
;
Song, Y.
;
Ku, J.
In:
Science and Technology of Food Industry
. (Science and Technology of Food Industry, March 2024, 45(5):234-242)
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Regional Variations in Peucedanum japonicum Antioxidants and Phytochemicals
Academic Journal
Uy, N.P.
;
Lee, S.
;
Kim, H.
;
Ku, J.
In:
Plants
. (Plants, February 2024, 13(3))
Full Text (Gale Academic Onefile)
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[AR] Ku, J.
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international journal of radiation oncology, biology, physics
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2006 symposium on vlsi technology, 2006. digest of technical papers.
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2006 symposium on vlsi technology, 2006. digest of technical papers., vlsi technology, 2006. digest of technical papers. 2006 symposium on
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ieee international electron devices meeting, 2005. iedm technical digest
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proceedings of the 11th international symposium on the physical & failure analysis of integrated circuits. ipfa 2004 (ieee cat. no.04th8743)
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stroke
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