학술논문
'학술논문'
에서 검색결과 134건 | 목록
1~10
Conference
Bosch, D.; Colinge, J. P.; Ghibaudo, G.; Garros, X.; Barraud, S.; Lacord, J.; Sklenard, B.; Brunet, L.; Batude, P.; Fenouillet-Beranger, C.; Cluzel, J.; Kies, R.; Hartmann, J. M.; Vizioz, C.; Audoit, G.; Balestra, F.; Andrieu, F.
2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
Conference
Bosch, D.; Colinge, J.P.; Lugo, J.; Tataridou, A.; Theodorou, C.; Garros, X.; Barraud, S.; Lacord, J.; Sklenard, B.; Casse, M.; Brunet, L.; Batude, P.; Fenouillet-Beranger, C.; Lattard, D.; Cluzel, J.; Allain, F.; Youcef, R. Nait; Hartmann, J.M.; Vizioz, C.; Audoit, G.; Balestra, F.; Andrieu, F.
2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) VLSI Technology, Systems and Applications (VLSI-TSA), 2020 International Symposium on. :126-127 Aug, 2020
Conference
Sandrini, J.; Grenouillet, L.; Meli, V.; Castellani, N.; Hammad, I.; Bernasconi, S.; Aussenac, F.; Van Duijn, S.; Audoit, G.; Barlas, M.; Nodin, J. F.; Billoint, O.; Molas, G.; Fournel, R.; Nowak, E.; Gaillard, F.; Cagli, C.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :30.5.1-30.5.4 Dec, 2019
Conference
Azzaz, M.; Benoist, A.; Vianello, E.; Garbin, D.; Jalaguier, E.; Cagli, C.; Charpin, C.; Bernasconi, S.; Jeannot, S.; Dewolf, T.; Audoit, G.; Guedj, C.; Denorme, S.; Candelier, P.; Fenouillet-Beranger, C.; Perniola, L.
2015 45th European Solid State Device Research Conference (ESSDERC) Solid State Device Research Conference (ESSDERC), 2015 45th European. :266-269 Sep, 2015
Conference
Barraud, S.; Previtali, B.; Lapras, V.; Vizioz, C.; Hartmann, J.-M.; Martinie, S.; Lacord, J.; Casse, M.; Dourthe, L.; Loup, V.; Romano, G.; Rambal, N.; Chalupa, Z.; Bernier, N.; Audoit, G.; Jannaud, A.; Delaye, V.; Balan, V.; Rozeau, O.; Ernst, T.; Vinet, M.
2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :21.3.1-21.3.4 Dec, 2018
Conference
Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2014 IEEE 21st International Symposium on the. :231-235 Jun, 2014
Conference
Pasini, L.; Batude, P.; Casse, M.; Mathieu, B.; Sklenard, B.; Luce, F. Piegas; Reboh, S.; Bernier, N.; Tabone, C.; Rozeau, O.; Martini, S.; Fenouillet-Beranger, C.; Brunet, L.; Audoit, G.; Lafond, D.; Aussenac, F.; Allain, F.; Romano, G.; Barraud, S.; Rambal, N.; Barral, V.; Hutin, L.; Hartmann, J-M.; Besson, P.; Kerdiles, S.; Haond, M.; Ghibaudo, G.; Vinet, M.
2015 Symposium on VLSI Technology (VLSI Technology) VLSI Technology (VLSI Technology), 2015 Symposium on. :T50-T51 Jun, 2015
Conference
Barraud, S.; Lapras, V.; Samson, M.P.; Gaben, L.; Grenouillet, L.; Maffini-Alvaro, V.; Morand, Y.; Daranlot, J.; Rambal, N.; Previtalli, B.; Reboh, S.; Tabone, C.; Coquand, R.; Augendre, E.; Rozeau, O.; Hartmann, J. M.; Vizioz, C.; Arvet, C.; Pimenta-Barros, P.; Posseme, N.; Loup, V.; Comboroure, C.; Euvrard, C.; Balan, V.; Tinti, I.; Audoit, G.; Bernier, N.; Cooper, D.; Saghi, Z.; Allain, F.; Toffoli, A.; Faynot, O.; Vinet, M.
2016 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2016 IEEE International. :17.6.1-17.6.4 Dec, 2016
Academic Journal
Barnes, J.P.; Grenier, A.; Mouton, I.; Barraud, S.; Audoit, G.; Bogdanowicz, J.; Fleischmann, C.; Melkonyan, D.; Vandervorst, W.; Duguay, S.; Rolland, N.; Vurpillot, F.; Blavette, D.
In Scripta Materialia 15 April 2018 148:91-97
Academic Journal
Oliveira, V.A.; Marie, B.; Cayron, C.; Marinova, M.; Tsoutsouva, M.G.; Sio, H.C.; Lafford, T.A.; Baruchel, J.; Audoit, G.; Grenier, A.; Tran Thi, T.N.; Camel, D.
In Acta Materialia December 2016 121:24-36
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[검색어] Audoit, G.
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