학술논문
'학술논문'
에서 검색결과 873건 | 목록
180~190
Academic Journal
Raghunathan, S.; Wood, O.R.; Mangat, P.; Verduijn, E.; Philipsen, V.; Hendrickx, E.; Jonckheere, R.; Goldberg, K.A.; Benk, M.P.; Kearney, P.; Levinson, Z.; Smith, B.W.
In: Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics . (Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, 1 November 2014, 32(6))
Academic Journal
In: Journal of Chemical Theory and Computation . (Journal of Chemical Theory and Computation, 14 October 2014, 10(10):4229-4241)
Academic Journal
In: Journal of Organizational Computing and Electronic Commerce . (Journal of Organizational Computing and Electronic Commerce, 13 October 2014, 24(4):366-387)
Conference
Zhou, K.; Guo, X.; Bian, Y.; Zhou, W.; Zhang, Y.; Van Mil, I.; Shi, E.; Zhu, R.; Zhu, J.; Mao, I.; Koolen, E.; Chi, K.; Trinchant, J.C.F.; Isai, G.; Chen, S.; Wang, J.; Wang, P.; Su, S.; Zhu, X.; Lin, K.; Pao, K.; Thuijs, K.; Lee, P.; Elmalk, A.; Raghunathan, S.; Zhang, A.; Liang, L.; Wang, X.; Zhang, G.
In: IWAPS 2021 - 2021 5th International Workshop on Advanced Patterning Solutions , IWAPS 2021 - 2021 5th International Workshop on Advanced Patterning Solutions. (IWAPS 2021 - 2021 5th International Workshop on Advanced Patterning Solutions, 2021)
Conference
He, W.; Xu, C.; Bae, D.; Chen, K.; Lan, A.; Yang, R.; Elmalk, A.; Jiang, A.; Wang, F.; Chung, D.; Su, S.; Pao, K.-F.; Patterson, O.D.; Raghunathan, S.; Kea, M.; Liao, J.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2021, 11611)
Conference
Zhou, W.; Wei, F.; Zhang, Y.; Zhu, J.; Hu, C.-Y.; Zhu, R.; Chen, S.; Lin, L.; Liang, L.; Cho, K.; Pao, K.-F.; Jain, V.; Elmalk, A.; Raghunathan, S.; Hunsche, S.; Liu, L.; Corradi, A.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2021, 11611)
Conference
Chen, K.-M.; Henke, W.; Jung, J.-H.; Kasperkiewicz, E.; Bouma, A.; Kim, G.-G.; Tsiachris, S.; Yoo, J.-D.; Park, Y.; Park, J.; Won, J.; Oh, N.-L.; Chen, H.-Y.; Lin, W.; Hsieh, C.-H.; Pao, K.-F.; Cho, K.; Elmalk, A.; Raghunathan, S.; Rahman, R.; Isai, G.; Jee, T.; Jeong, S.-U.; Jae, J.; Kim, S.-W.; Lee, D.; Kim, J.; Ma, W.; Lee, S.-H.; Park, C.-H.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2021, 11611)
Academic Journal
In: European Journal of Pharmacology . (European Journal of Pharmacology, 5 April 2014, 728(1):128-134)
Academic Journal
In: Decision Support Systems . (Decision Support Systems, February 2014, 58(1):79-94)
Academic Journal
Kusaka, A.; Essinger-Hileman, T.; Appel, J.W.; Jarosik, N.; Page, L.A.; Parker, L.P.; Sievers, J.L.; Simon, S.M.; Staggs, S.T.; Visnjic, K.; Gallardo, P.; Irwin, K.D.; Nolta, M.R.; Raghunathan, S.
In: Review of Scientific Instruments . (Review of Scientific Instruments, February 2014, 85(2))
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[AR] Raghunathan, S.
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