학술논문
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Academic Journal
Khakifirooz, A.; Anaya, E.; Balasubrahmanyam, S.; Bennett, G.; Castro, D.; Egler, J.; Fan, K.; Ferdous, R.; Ganapathi, K.; Guzman, O.; Ha, C.W.; Haque, R.; Harish, V.; Jalalifar, M.; Jungroth, O.W.; Kang, S.; Karbasian, G.; Kim, J.; Li, S.; Madraswala, A.S.; Maddukuri, S.; Mohammed, A.; Mookiah, S.; Nagabhushan, S.; Ngo, B.; Patel, D.; Poosarla, S.K.; Prabhu, N.V.; Quiroga, C.; Rajwade, S.; Rahman, A.; Shah, J.; Shenoy, R.S.; Menson, E.T.; Tankasala, A.; Thirumala, S.K.; Upadhyay, S.; Upadhyayula, K.; Velasco, A.; Vemula, N.K.B.; Venkataramaiah, B.; Zhou, J.; Pathak, B.M.; Kalavade, P.
IEEE Solid-State Circuits Letters IEEE Solid-State Circuits Lett. Solid-State Circuits Letters, IEEE. 6:161-164 2023
Academic Journal
In International Journal of Refrigeration September 2012 35(6):1766-1778
Conference
Annual Reliability and Maintainability Symposium. 1998 Proceedings. International Symposium on Product Quality and Integrity Reliability and maintainability Reliability and Maintainability Symposium, 1998. Proceedings., Annual. :345-357 1998
Conference
Khakifirooz, A.; Bennett, G.; Fan, K.; Ferdous, R.; Ganapathi, K.; Guzman, O.; Ha, C.W.; Haque, R.; Harish, V.; Karbasian, G.; Kim, J.-Y.; Madraswala, A.S.; Maddukuri, S.; Mohammed, A.; Mookiah, S.; Ngo, B.; Patel, D.; Poosarla, S.K.; Prabhu, N.V.; Quiroga, C.; Rajwade, S.; Rahman, A.; Shah, J.; Shenoy, R.S.; Menson, E.T.; Tankasala, A.; Thirumala, S.K.; Upadhyay, S.; Vemula, N.K.B.; Zhou, J.; Kalavade, P.; Anaya, E.; Balasubrahrmanyam, S.; Castro, D.; Egler, J.; Jalalifar, M.; Jungroth, O.W.; Kang, S.-T.; Li, S.; Nagabhushan, S.; Upadhyayula, K.; Velasco, A.; Venkataramaiah, B.; Pathak, B.M.
In: Digest of Technical Papers - IEEE International Solid-State Circuits Conference , 2023 IEEE International Solid-State Circuits Conference, ISSCC 2023. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference, 2023, 2023-February:400-402)
Conference
In: AIP Conference Proceedings , SiliconPV 2019 - 9th International Conference on Crystalline Silicon Photovoltaics. (AIP Conference Proceedings, 27 August 2019, 2147)
Conference
In: AIP Conference Proceedings , SiliconPV 2018, the 8th International Conference on Crystalline Silicon Photovoltaics. (AIP Conference Proceedings, 10 August 2018, 1999)
Academic Journal
In: International Journal of Damage Mechanics . (International Journal of Damage Mechanics, April 2001, 10(2):101-132)
Academic Journal
In: Microelectronics Reliability . (Microelectronics Reliability, 1998, 38(4):581-584)
Academic Journal
In: Quality and Reliability Engineering International . (Quality and Reliability Engineering International, November/December 1998, 14(6):433-447)
Conference
Tanaka, T.; Kawai, K.; Yamada, S.; Einaga, Y.; Tanzawa, T.; Ichikawa, T.; Tamada, S.; Manabe, T.; Kishimoto, J.; Oikawa, Y.; Takashima, Y.; Kuge, H.; Morooka, M.; Helm, M.; Ghodsi, R.; Park, J.-K.; Pan, F.; Ghalam, A.; Guo, J.; Yu, E.; Mohammadzadeh, A.; Kang, J.; Tsai, J.; Lee, E.; Vu, L.; Liu, Y.; Choi, H.; Cheon, K.; Song, D.; Shin, D.; Yun, J.H.; Piccardi, M.; Chan, K.-F.; Luthra, Y.; Srinivasan, D.; Deshmukh, S.; Kavalipurapu, K.; Nguyen, D.; Ramprasad, S.; Luo, M.; Tang, Q.; Lee, H.; Patel, V.; Pekny, T.; Yip, A.; Vali, T.; Sirizotti, E.; Gallo, G.; Incarnati, M.; MacErola, A.; Pilolli, L.; De Santis, L.; Rossini, M.; Moschiano, V.; Santin, G.; Tronca, B.; Prabhu, N.; Sule, P.; Bemalkhedkar, T.; Upadhyayula, K.; Jaramillo, C.
In: Digest of Technical Papers - IEEE International Solid-State Circuits Conference , 2016 IEEE International Solid-State Circuits Conference, ISSCC 2016. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference, 23 February 2016, 59:142-144)
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[AR] Upadhyayula, K.
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