학술논문
'학술논문'
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Academic Journal
In: Experimental Gerontology . (Experimental Gerontology, July 2023, 178)
Academic Journal
In: Journal of Neuroimaging . (Journal of Neuroimaging, November/December 2022, 32(6):1211-1223)
Academic Journal
Church, J.; Meli, L.; Guo, J.; De Silva, A.; Petrillo, K.; Breton, M.; Bonam, R.; Lallement, R.; Miller, E.; Austin, B.; Matham, S.; Felix, N.; Burkhardt, M.; Mack, C.
In: Journal of Micro/ Nanolithography, MEMS, and MOEMS . (Journal of Micro/ Nanolithography, MEMS, and MOEMS, 1 July 2020, 19(3))
Conference
2000 International Conference on Simulation Semiconductor Processes and Devices (Cat. No.00TH8502) Simulation of semiconductor processes and devices Simulation of Semiconductor Processes and Devices, 2000. SISPAD 2000. 2000 International Conference on. :131-134 2000
Conference
Kato, K.; Huli, L.; Antonovich, N.; Hetzer, D.; Grzeskowiak, S.; Liu, E.; Ko, A.; Shimura, S.; Kawakami, S.; Kitano, T.; Nagahara, S.; Meli, L.; Seshadri, I.; Burkhardt, M.; Petrillo, K.
In: Proceedings of SPIE - The International Society for Optical Engineering , Advances in Patterning Materials and Processes XL. (Proceedings of SPIE - The International Society for Optical Engineering, 2023, 12498)
Conference
Huli, L.; Kato, K.; Gueci, S.; Antonovich, N.; Grzeskowiak, S.; Hetzer, D.; Liu, E.; Krawicz, A.; Shimura, S.; Kawakami, S.; Okada, S.; Petrillo, K.; Meli, L.; Latham, N.; Cabrera, Y.; Antonovich, B.
In: Proceedings of SPIE - The International Society for Optical Engineering , Advances in Patterning Materials and Processes XL. (Proceedings of SPIE - The International Society for Optical Engineering, 2023, 12498)
Conference
Haran, B. S.; Kumar, A.; Adam, L.; Chang, J.; Basker, V.; Kanakasabapathy, S.; Horak, D.; Fan, S.; Chen, J.; Faltermeier, J.; Seo, S.; Burkhardt, M.; Burns, S.; Halle, S.; Holmes, S.; Johnson, R.; McLellan, E.; Levin, T. M.; Zhu, Y.; Kuss, J.; Ebert, A.; Cummings, J.; Canaperi, D.; Paparao, S.; Arnold, J.; Sparks, T.; Koay, C. S.; Kanarsky, T.; Schmitz, S.; Petrillo, K.; Kim, R. H.; Demarest, J.; Edge, L. F.; Jagannathan, H.; Smalley, M.; Berliner, N.; Cheng, K.; LaTulipe, D.; Koburger, C.; Mehta, S.; Raymond, M.; Colburn, M.; Spooner, T.; Paruchuri, V.; Haensch, W.; McHerron, D.; Doris, B.
2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008
Academic Journal
Meli, L.; Petrillo, K.; De Silva, A.; Arnold, J.; Felix, N.; Robinson, C.; Briggs, B.; Matham, S.; Mignot, Y.; Shearer, J.; Hamieh, B.; Hontake, K.; Huli, L.; Lemley, C.; Hetzer, D.; Liu, E.; Akiteru, K.; Kawakami, S.; Shimoaoki, T.; Hashimoto, Y.; Ichinomiya, H.; Kai, A.; Tanaka, K.; Jain, A.; Choi, H.; Saville, B.; Lenox, C.
In: Journal of Micro/ Nanolithography, MEMS, and MOEMS . (Journal of Micro/ Nanolithography, MEMS, and MOEMS, 1 January 2019, 18(1))
Academic Journal
De Silva, A.; Seshadri, I.; Arceo, A.; Petrillo, K.; Meli, L.; Mendoza, B.; Yao, Y.; Belyansky, M.; Halle, S.; Felix, N.M.
In: Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics . (Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, 1 November 2016, 34(6))
Conference
Proceedings. IEEE International SOI Conference SOI conference SOI Conference, 1994 Proceedings., 1994 IEEE International. :111-112 1994
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[AR] Petrillo, K.
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