학술논문
'학술논문'
에서 검색결과 141건 | 목록
10~20
Conference
Chevalier, P.; Gianesello, F.; Pallotta, A.; Goncalves, J. Azevedo; Bertrand, G.; Borrel, J.; Boissonnet, L.; Brezza, E.; Buczko, M.; Canderle, E.; Celi, D.; Cremer, S.; Derrier, N.; Diouf, C.; Durand, C.; Foussadier, F.; Garcia, P.; Guitard, N.; Fleury, A.; Gauthier, A.; Kermarrec, O.; Lajoinie, J.; Legrand, C.A.; Milon, V.; Monsieur, F.; Mourier, Y.; Muller, D.; Ney, D.; Paulin, R.; Pelloux, N.; Renard, C.; Rellier, M.L.; Scheer, P.; Sicard, I.; Vulliet, N.; Juge, A.; Granger, E.; Gloria, D.; Uginet, J.; Garchery, L.; Paillardet, F.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :34.4.1-34.4.4 Dec, 2020
Academic Journal
Berlingard, Q.; Lugo-Alvarez, J.; Contamin, L.; Vinet, M.; Cassé, M.; Gaillard, F.; Durand, C.; Galy, P.; Juge, A.; De Franceschi, S.; Meunier, T.
In: Solid-State Electronics . (Solid-State Electronics, August 2022, 194)
Conference
2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2016 International Conference on. :7-14 Sep, 2016
Conference
Gianesello, F.; Monroy, A.; Vialla, V.; Canderle, E.; Bertrand, G.; Buczko, M.; Coly, M.; Nowakowski, Jeff; Revil, N.; Rolland, L.; Gloria, D.; Juge, A.; Gachon, S.; Aubert, J. P.; Granger, E.
2016 IEEE 16th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2016 IEEE 16th Topical Meeting on. :9-12 Jan, 2016
Front and back channels coupling and transport on 28 nm FD-SOI MOSFETs down to liquid-He temperature
Academic Journal
Paz, B.C.; Cassé, M.; Vinet, M.; Gaillard, F.; Haendler, S.; Juge, A.; Vincent, E.; Galy, P.; Arnaud, F.; Ghibaudo, G.; de Franceschi, S.; Meunier, T.
In: Solid-State Electronics . (Solid-State Electronics, December 2021, 186)
Conference
2005 International Conference On Simulation of Semiconductor Processes and Devices Simulation of Semiconductor Processes and Devices, 2005. SISPAD 2005. International Conference on. :319-322 2005
Conference
Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) Microelectronic test structures Microelectronic Test Structures, 2004. Proceedings. ICMTS '04. The International Conference on. :149-154 2004
Conference
International Conference on Microelectronic Test Structures, 2003. Microelectronic test structures Microelectronic Test Structures, 2003. International Conference on. :191-196 2003
Conference
ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) Microelectronic test structures Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on. :263-267 2001
Conference
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) Electrical overstress/electrostatic discharge symposium Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000. :251-259 2000
검색 결과 제한하기
제한된 항목
[AR] Juge, A.
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