학술논문
'학술논문'
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Academic Journal
In: IEEE Transactions on Cloud Computing . (IEEE Transactions on Cloud Computing, 2024, :1-15)
Academic Journal
Fenouillet-Beranger, C.; Perreau, P.; Benoist, T.; Richier, C.; Haendler, S.; Pradelle, J.; Bustos, J.; Brun, P.; Tosti, L.; Weber, O.; Andrieu, F.; Orlando, B.; Pellissier-Tanon, D.; Abbate, F.; Richard, C.; Beneyton, R.; Gregoire, M.; Ducote, J.; Gouraud, P.; Margain, A.; Borowiak, C.; Bianchini, R.; Planes, N.; Gourvest, E.; Bourdelle, K.K.; Nguyen, B.Y.; Poiroux, T.; Skotnicki, T.; Faynot, O.; Boeuf, F.
In Solid State Electronics October 2013 88:15-20
Conference
Fenouillet-Beranger, C.; Perreau, P.; Benoist, T.; Richier, C.; Haendler, S.; Pradelle, J.; Bustos, J.; Brun, P.; Tosti, L.; Weber, O.; Andrieu, F.; Orlando, B.; Pellissier-Tanon, D.; Abbate, F.; Pvichard, C.; Beneyton, R.; Gregoire, M.; Ducote, J.; Gouraud, P.; Margain, A.; Borowiak, C.; Bianchini, R.; Planes, N.; Gourvest, E.; Bourdelle, K. K.; Nguyen, B. Y.; Poiroux, T.; Skotnicki, T.; Faynot, O.; Boeuf, F.
2012 13th International Conference on Ultimate Integration on Silicon (ULIS) Ultimate Integration on Silicon (ULIS), 2012 13th International Conference on. :165-168 Mar, 2012
Conference
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) Electrical overstress/electrostatic discharge symposium Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000. :251-259 2000
Academic Journal
In: Theatre and Performance Design . (Theatre and Performance Design, 2020, 6(3):221-242)
Academic Journal
In Microelectronics Reliability 1999 39(6):833-838
Conference
Proceedings Electrical Overstress/Electrostatic Discharge Symposium Electrical overstress/electrostatic discharge symposium Electrical Overstress/Electrostatic Discharge Symposium,1997. Proceedings. :240-245 1997
Conference
Golanski, D.; Fonteneau, P.; Fenouillet-Beranger, C.; Cros, A.; Monsieur, F.; Guitard, N.; Legrand, C-A; Dray, A.; Richier, C.; Beckrich, H.; Mora, P.; Bidal, G.; Weber, O.; Saxod, O.; Manouvrier, J-R.; Galy, P.; Planes, N.; Arnaud, F.
2013 Symposium on VLSI Technology VLSI Technology (VLSIT), 2013 Symposium on. :T124-T125 Jun, 2013
Conference
Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on. :1723-1726 1996
Conference
2005 Electrical Overstress/Electrostatic Discharge Symposium Electrical Overstress/Electrostatic Discharge Symposium, 2005. EOS/ESD '05.. :1-8 Sep, 2005
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[AR] Richier, C.
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