학술논문
'학술논문'
에서 검색결과 20건 | 목록
10~20
Conference
ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) Microelectronic test structures Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on. :7-10 2001
Conference
31st European Solid-State Device Research Conference Solid-State Device Research Conference, 2001. Proceeding of the 31st European. :299-302 2001
Conference
30th European Solid-State Device Research Conference Solid-State Device Research Conference, 2000. Proceeding of the 30th European. :584-587 2000
Conference
Arnaud, F.; Duriez, B.; Tavel, B.; Pain, L.; Todeschini, J.; Jurdit, M.; Laplanche, Y.; Boeuf, F.; Salvetti, F.; Lenoble, D.; Reynard, J.P.; Wacquant, F.; Morin, P.; Emonet, N.; Barge, D.; Bidaud, M.; Ceccarelli, D.; Vannier, P.; Loquet, Y.; Leninger, H.; Judong, F.; Perrot, C.; Guilmeau, I.; Palla, R.; Beverina, A.; DeJonghe, V.; Broekaart, M.; Vachellerie, V.; Bianchi, R.A.; Borot, B.; Devoivre, T.; Bicais, N.; Roy, D.; Denais, M.; Rochereau, K.; Difrenza, R.; Planes, N.; Brut, H.; Vishnobulta, L.; Reber, D.; Stolk, P.; Woo, M.
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. VLSI technology VLSI Technology, 2004. Digest of Technical Papers. 2004 Symposium on. :10-11 2004
Conference
Tavel, B.; Bidaud, M.; Emonet, N.; Barge, D.; Planes, N.; Brut, H.; Roy, D.; Vildeuil, J.C.; Difrenza, R.; Rochereau, K.; Denais, M.; Huard, V.; Llinares, P.; Bruyere, S.; Parthasarthy, C.; Revil, N.; Pantel, R.; Guyader, F.; Vishnubotla, L.; Barla, K.; Arnaud, F.; Stolk, P.; Woo, M.
IEEE International Electron Devices Meeting 2003 Electron devices IEDM'03 Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International. :27.6.1-27.6.4 2003
Conference
ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153); 2001, p7-10, 4p
Academic Journal
Academic Journal
Conference
In: IEEE International Conference on Microelectronic Test Structures . (IEEE International Conference on Microelectronic Test Structures, 2004, :123-126)
Conference
Duriez, B.; Tavel, B.; Ortolland, C.; Bidaud, M.; Barge, D.; Dachs, C.; Rochereau, K.; Stolk, P.; Boeuf, F.; Basso, M.T.; Laplanche, Y.; Wacquant, F.; Morin, P.; Lenoble, D.; Palla, R.; Brut, H.; Roy, D.; Marin, M.; Payet, F.; Cagnat, N.; Difrenza, R.; Denais, M.; Arnaud, F.; Reber, D.; Woo, M.
In: Technical Digest - International Electron Devices Meeting, IEDM , Technical Digest - IEEE International Electron Devices Meeting, 2004 IEDM (50th Annual Meeting). (Technical Digest - International Electron Devices Meeting, IEDM, 2004, :847-850)
검색 결과 제한하기
제한된 항목
[AR] Difrenza, R.
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