학술논문
'학술논문'
에서 검색결과 128건 | 목록
10~20
Academic Journal
In: JTCVS Techniques . (JTCVS Techniques, December 2021, 10:322-330)
Conference
Chen, F.; Gill, J.; Harmon, D.; Sullivan, T.; Li, B.; Strong, A.; Rathore, H.; Edelstein, D.; Yang, C.-C.; Cowley, A.; Clevenger, L.
2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :68-73 2004
Conference
Edelstein, D.; Rathore, H.; Davis, C.; Clevenger, L.; Cowley, A.; Nogami, T.; Agarwala, B.; Arai, S.; Carbone, A.; Chanda, K.; Chen, F.; Cohen, S.; Cote, W.; Cullinan, M.; Dalton, T.; Das, S.; Davis, P.; Demarest, J.; Dunn, D.; Dziobkowski, C.; Filippi, R.; Fitzsimmons, J.; Flaitz, P.; Gates, S.; Gill, J.; Grill, A.; Hawken, D.; Ida, K.; Klaus, D.; Klymko, N.; Lane, M.; Lane, S.; Lee, J.; Landers, W.; Li, W.-K.; Lin, Y.-H.; Liniger, E.; Liu, X.-H.; Madan, A.; Malhotra, S.; Martin, J.; Molis, S.; Muzzy, C.; Nguyen, D.; Nguyen, S.; Ono, M.; Parks, C.; Questad, D.; Restaino, D.; Sakamoto, A.; Shaw, T.; Shimooka, Y.; Simon, A.; Simonyi, E.; Swift, A.; Van Kleeck, T.; Vogt, S.; Wang, Y.-Y.; Wille, W.; Wright, J.; Yang, C.-C.; Yoon, M.; Ivers, T.
2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :316-319 2004
Academic Journal
Conference
Kioussis, D.; Ryan, E.T.; Madan, A.; Klymko, N.; Molis, S.; Sun, Z.; Masuda, H.; Liang, S.; Lee, T.; Restaino, D.; Clevenger, L.; Quon, R.; Augur, R.; Child, C.; Gates, S.M.; Grill, A.; Shobha, H.; Sundlof, B.; Shaw, T.; Bonilla, G.; Daubenspeck, T.; Osborne, G.; Cohen, S.; Virwani, K.
2011 IEEE International Interconnect Technology Conference Interconnect Technology Conference and 2011 Materials for Advanced Metallization (IITC/MAM), 2011 IEEE International. :1-3 May, 2011
Conference
Ando, T.; Cartier, E.; Jamison, P.; Pyzyna, A.; Kim, S.; Bruley, J.; Chung, K.; Shobha, H.; Estrada-Raygoza, I.; Tang, H.; Kanakasabapathy, S.; Spooner, T.; Clevenger, L.; Bonilla, G.; Jagannathan, H.; Narayanan, V.
2016 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2016 IEEE International. :9.4.1-9.4.4 Dec, 2016
Conference
Radens, C.J.; Kudelka, S.; Nesbit, L.; Malik, R.; Dyer, T.; Dubuc, C.; Joseph, T.; Seitz, M.; Clevenger, L.; Arnold, N.; Mandelman, J.; Divakaruni, R.; Casarotto, D.; Lea, D.; Jaiprakash, V.C.; Sim, J.; Faltermeier, J.; Low, K.; Strane, J.; Halle, S.; Ye, Q.; Bukofsky, S.; Gruening, U.; Schloesser, T.; Bronner, G.
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :349-352 2000
Conference
Yang, C.-C.; Edelstein, D.; Clevenger, L.; Cowley, A.; Gill, J.; Chanda, K.; Simon, A.; Dalton, T.; Agarwala, B.; Cooney, E., III; Nguyen, D.; Spooner, T.; Stamper, A.
Proceedings of the IEEE 2005 International Interconnect Technology Conference, 2005. Interconnect technology Interconnect Technology Conference, 2005. Proceedings of the IEEE 2005 International. :135-137 2005
Conference
Landers, W.; Edelstein, D.; Clevenger, L.; Das, C.; Yang, C.-C.; Aoki, T.; Beaulieu, F.; Casey, J.; Cowley, A.; Cullinan, M.; Daubenspeck, T.; Davis, C.; Demarest, J.; Duchesne, E.; Guerin, L.; Hawken, D.; Ivers, T.; Lane, M.; Liu, X.; Lombardi, T.; McCarthy, C.; Muzzy, C.; Nadeau-Filteau, J.; Questad, D.; Sauter, W.; Shaw, T.; Wright, J.
Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729) Interconnect technology Interconnect Technology Conference, 2004. Proceedings of the IEEE 2004 International. :108-110 2004
Conference
Edelstein, D.; Davis, C.; Clevenger, L.; Yoon, M.; Cowley, A.; Nogami, T.; Rathore, H.; Agarwala, B.; Arai, S.; Carbone, A.; Chanda, K.; Cohen, S.; Cote, W.; Cullinan, M.; Dalton, T.; Das, S.; Davis, P.; Demarest, J.; Dunn, D.; Dziobkowski, C.; Filippi, R.; Fitzsimmons, J.; Flaitz, P.; Gates, S.; Gill, J.; Grill, A.; Hawken, D.; Ida, K.; Klaus, D.; Klymko, N.; Lane, M.; Lane, S.; Lee, J.; Landers, W.; Li, W.-K.; Lin, Y.-H.; Liniger, E.; Liu, X.-H.; Madan, A.; Malhotra, S.; Martin, J.; Molis, S.; Muzzy, C.; Nguyen, D.; Nguyen, S.; Ono, M.; Parks, C.; Questad, D.; Restaino, D.; Sakamoto, A.; Shaw, T.; Shimooka, Y.; Simon, A.; Simonyi, E.; Tempest, S.; Van Kleeck, T.; Vogt, S.; Wang, Y.-Y.; Wille, W.; Wright, J.; Yang, C.-C.; Ivers, T.
Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729) Interconnect technology Interconnect Technology Conference, 2004. Proceedings of the IEEE 2004 International. :214-216 2004
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[AR] Clevenger, L.
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