학술논문
'학술논문'
에서 검색결과 46건 | 목록
1~10
Conference
Shaw, T.M.; Liu, X-H; Misra, E.; Questad, D.; Bonilla, G.; Wassick, T.; Lamorey, M.; Shobha, H.; Osborne, G.; Kioussis, D.; Wright, J.; Bisson, R.; Paquin, I.; Bouchard, S.S.; Tetreault, S.; Stone, D.; Muzzy, C.; Sundlof, B.; Daubenspeck, T.
2015 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2015 IEEE International. :115-118 Oct, 2015
Conference
2014 IEEE 64th Electronic Components and Technology Conference (ECTC) Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th. :1949-1954 May, 2014
Conference
Misra, E.; Daubenspeck, T.; Wassick, T.; Tunga, K.; Questad, D.; Osborne, G.; Shaw, T. M.; McLaughlin, K.
2013 IEEE 63rd Electronic Components and Technology Conference Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd. :2208-2213 May, 2013
Conference
Misra, E.; Daubenspeck, T.; Wassick, T.; Scott, G. J.; Tunga, K.; Lafontant, G.; Questad, D.; Osborne, G.; Sullivan, T.
2012 IEEE 62nd Electronic Components and Technology Conference Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd. :571-576 May, 2012
Conference
Takiguchi, I.; Tamura, T.; Yazawa, K.; Coffin, J.; Yarmchuk, E.; Harvey, P.; Wang, M.; Weger, A.; Hamann, H.; Gaynes, M.; Questad, D.; Wakil, J.
Thermal and Thermomechanical Proceedings 10th Intersociety Conference on Phenomena in Electronics Systems, 2006. ITHERM 2006. Thermal and Thermomechanical Phenomena in Electronics Systems Thermal and Thermomechanical Phenomena in Electronics Systems, 2006. ITHERM '06. The Tenth Intersociety Conference on. :289-296 2006
Conference
Edelstein, D.; Rathore, H.; Davis, C.; Clevenger, L.; Cowley, A.; Nogami, T.; Agarwala, B.; Arai, S.; Carbone, A.; Chanda, K.; Chen, F.; Cohen, S.; Cote, W.; Cullinan, M.; Dalton, T.; Das, S.; Davis, P.; Demarest, J.; Dunn, D.; Dziobkowski, C.; Filippi, R.; Fitzsimmons, J.; Flaitz, P.; Gates, S.; Gill, J.; Grill, A.; Hawken, D.; Ida, K.; Klaus, D.; Klymko, N.; Lane, M.; Lane, S.; Lee, J.; Landers, W.; Li, W.-K.; Lin, Y.-H.; Liniger, E.; Liu, X.-H.; Madan, A.; Malhotra, S.; Martin, J.; Molis, S.; Muzzy, C.; Nguyen, D.; Nguyen, S.; Ono, M.; Parks, C.; Questad, D.; Restaino, D.; Sakamoto, A.; Shaw, T.; Shimooka, Y.; Simon, A.; Simonyi, E.; Swift, A.; Van Kleeck, T.; Vogt, S.; Wang, Y.-Y.; Wille, W.; Wright, J.; Yang, C.-C.; Yoon, M.; Ivers, T.
2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :316-319 2004
Conference
Landers, W.; Edelstein, D.; Clevenger, L.; Das, C.; Yang, C.-C.; Aoki, T.; Beaulieu, F.; Casey, J.; Cowley, A.; Cullinan, M.; Daubenspeck, T.; Davis, C.; Demarest, J.; Duchesne, E.; Guerin, L.; Hawken, D.; Ivers, T.; Lane, M.; Liu, X.; Lombardi, T.; McCarthy, C.; Muzzy, C.; Nadeau-Filteau, J.; Questad, D.; Sauter, W.; Shaw, T.; Wright, J.
Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729) Interconnect technology Interconnect Technology Conference, 2004. Proceedings of the IEEE 2004 International. :108-110 2004
Conference
Edelstein, D.; Davis, C.; Clevenger, L.; Yoon, M.; Cowley, A.; Nogami, T.; Rathore, H.; Agarwala, B.; Arai, S.; Carbone, A.; Chanda, K.; Cohen, S.; Cote, W.; Cullinan, M.; Dalton, T.; Das, S.; Davis, P.; Demarest, J.; Dunn, D.; Dziobkowski, C.; Filippi, R.; Fitzsimmons, J.; Flaitz, P.; Gates, S.; Gill, J.; Grill, A.; Hawken, D.; Ida, K.; Klaus, D.; Klymko, N.; Lane, M.; Lane, S.; Lee, J.; Landers, W.; Li, W.-K.; Lin, Y.-H.; Liniger, E.; Liu, X.-H.; Madan, A.; Malhotra, S.; Martin, J.; Molis, S.; Muzzy, C.; Nguyen, D.; Nguyen, S.; Ono, M.; Parks, C.; Questad, D.; Restaino, D.; Sakamoto, A.; Shaw, T.; Shimooka, Y.; Simon, A.; Simonyi, E.; Tempest, S.; Van Kleeck, T.; Vogt, S.; Wang, Y.-Y.; Wille, W.; Wright, J.; Yang, C.-C.; Ivers, T.
Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729) Interconnect technology Interconnect Technology Conference, 2004. Proceedings of the IEEE 2004 International. :214-216 2004
Conference
Shaw, T. M.; Liu, X-H; Misra, E.; Questad, D.; Bonilla, G.; Wassick, T.; Shobha, H.; Smith, K.; Osborne, G.; Kioussis, D.; Wright, J.; Bisson, R.; Paquin, I.; Lamorey, M.; Bouchard, S. S.; Tetreault, S.; Stone, D.; Muzzy, C.; Sundlof, B.; Daubenspeck, T.
2016 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2016 IEEE International. :6B-4-1-6B-4-6 Apr, 2016
Conference
Harvey, P.; Mandrekar, R.; Zhou, Y.; Zheng, J.; Maloney, J.; Cain, S.; Kawasaki, K.; Lafontant, G.; Noma, H.; Imming, K.; Plachy, T.; Questad, D.
2008 58th Electronic Components and Technology Conference Electronic Components and Technology Conference, 2008. ECTC 2008. 58th. :1368-1371 May, 2008
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[AR] Questad, D.
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