학술논문
'학술논문'
에서 검색결과 67건 | 목록
1~10
Conference
2017 29th International Conference on Microelectronics (ICM) Microelectronics (ICM), 2017 29th International Conference on. :1-4 Dec, 2017
Conference
Andrieu, F.; Casse, M.; Baylac, E.; Perreau, P.; Nier, O.; Rideau, D.; Berthelon, R.; Pourchon, F.; Pofelski, A.; De Salvo, B.; Gallon, C.; Mazzocchi, V.; Barge, D.; Gaumer, C.; Gourhant, O.; Cros, A.; Barral, V.; Ranica, R.; Planes, N.; Schwarzenbach, W.; Richard, E.; Josse, E.; Weber, O.; Arnaud, F.; Vinet, M.; Faynot, O.; Haond, M.
2014 44th European Solid State Device Research Conference (ESSDERC) Solid State Device Research Conference (ESSDERC), 2014 44th European. :106-109 Sep, 2014
Conference
Chevalier, P.; Lacave, T.; Canderle, E.; Pottrain, A.; Carminati, Y.; Rosa, J.; Pourchon, F.; Derrier, N.; Avenier, G.; Montagné, A.; Balteanu, A.; Dacquay, E.; Sarkas, I.; Céli, D.; Gloria, D.; Gaquière, C.; Voinigescu, S. P.; Chantre, A.
2012 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) Compound Semiconductor Integrated Circuit Symposium (CSICS), 2012 IEEE. :1-4 Oct, 2012
Conference
2011 6th European Microwave Integrated Circuit Conference Microwave Integrated Circuits Conference (EuMIC), 2011 European. :57-60 Oct, 2011
Conference
d'Alessandro, V.; Marano, I.; Russo, S.; Celi, D.; Chantre, A.; Chevalier, P.; Pourchon, F.; Rinaldi, N.
2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2010 IEEE. :137-140 Oct, 2010
Conference
2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2010 IEEE. :98-101 Oct, 2010
Conference
Ardouin, B.; Raya, C.; Schroter, M.; Pawlak, A.; Celi, D.; Pourchon, F.; Aufinger, K.; Meister, T. F.; Zimmer, T.
The 5th European Microwave Integrated Circuits Conference Microwave Integrated Circuits Conference (EuMIC), 2010 European. :25-28 Sep, 2010
Conference
2006 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on. :35-40 2006
Conference
2006 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on. :169-172 2006
Conference
Chevalier, P.; Lagarde, D.; Avenier, G.; Schwartzmann, T.; Barbalat, B.; Lenoble, D.; Bustos, J.; Pourchon, F.; Saguin, F.; Vandelle, B.; Rubaldo, L.; Chantre, A.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :963-966 2005
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제한된 항목
[AR] Pourchon, F.
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