학술논문
'학술논문'
에서 검색결과 7건 | 목록
1~10
Totally Silicided (TOSI) Gates as an evolutionary metal gate solution for advanced CMOS technologies
Conference
2006 IEEE International Conference on IC Design and Technology Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference on. :1-6 2006
Conference
Muller, M.; Mondot, A.; Gierczynski, N.; Aime, D.; Froment, B.; Leverd, F.; Gouraud, P.; Talbot, A.; Descombes, S.; Morand, Y.; Le Tiec, Y.; Besson, P.; Toffoli, A.; Ribes, G.; Roux, J.-M.; Pokrant, S.; Andre, F.; Skotnicki, T.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :626-629 2005
Conference
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual Reliability physics symposium, 2007. proceedings. 45th annual. ieee international. :668-669 Apr, 2007
Conference
Boeuf, F.; Arnaud, F.; Boccaccio, C.; Salvetti, F.; Todeschini, J.; Pain, L.; Jurdit, M.; Manakli, S.; Icard, B.; Planes, N.; Gierczynski, N.; Denorme, S.; Borot, B.; Ortolland, C.; Duriez, B.; Tavel, B.; Gouraud, P.; Broekaart, M.; Dejonghe, V.; Brun, P.; Guyader, F.; Morini, P.; Reddy, C.; Aminpur, M.; Laviron, C.; Smith, S.; Jacquemin, J.P.; Mellier, M.; Andre, F.; Bicais-Lepinay, N.; Jullian, S.; Bustos, J.; Skotnicki, T.
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. VLSI Technology VLSI Technology, 2005. Digest of Technical Papers. 2005 Symposium on. :130-131 2005
Conference
Vandooren, A.; Hobbs, C.; Faynot, O.; Perreau, P.; Denorme, S.; Fenouillet-Beranger, C.; Gallon, C.; Morin, C.; Zauner, A.; lmbert, G.; Bernard, H.; Garnier, P.; Gabette, L.; Broekaart, M.; Aminpur, M.; Barnola, S.; Loubet, N.; Dutartre, D.; Korman, T.; Chabanne, G.; Martin, F.; Le Tiec, Y.; Gierczynski, N.; Smith, S.; Laviron, C.; Bidaud, M.; Pouilloux, I.; Bensahel, D.; Skotnicki, T.; Mingam, H.; Wild, A.
2005 IEEE International SOI Conference Proceedings SOI Conference SOI Conference, 2005. Proceedings. 2005 IEEE International. :221-222 2005
Conference
2007 IEEE International Conference on Microelectronic Test Structures; 2007, p97-100, 4p
Conference
Boeuf, F.; Arnaud, F.; Boccaccio, C.; Salvetti, F.; Todeschini, J.; Pain, L.; Jurdit, M.; Manakli, S.; Icard, B.; Planes, N.; Gierczynski, N.; Denorme, S.; Borot, B.; Ortolland, C.; Duriez, B.; Tavel, B.; Gouraud, P.; Broekaart, M.; Dejonghe, V.; Brun, P.
2005 Digest of Technical Papers. 2005 Symposium on VLSI Technology; 2005, p130-131, 2p
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[AR] Gierczynski, N.
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