학술논문
'학술논문'
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Conference
Goldblatt, R.D.; Agarwala, B.; Anand, M.B.; Barth, E.P.; Biery, G.A.; Chen, Z.G.; Cohen, S.; Connolly, J.B.; Cowley, A.; Dalton, T.; Das, S.K.; Davis, C.R.; Deutsch, A.; DeWan, C.; Edelstein, D.C.; Emmi, P.A.; Faltermeier, C.G.; Fitzsimmons, J.A.; Hedrick, J.; Heidenreich, J.E.; Hu, C.K.; Hummel, J.P.; Jones, P.; Kaltalioglu, E.; Kastenmeier, B.E.; Krishnan, M.; Landers, W.F.; Liniger, E.; Liu, J.; Lustig, N.E.; Malhotra, S.; Manger, D.K.; McGahay, V.; Mih, R.; Nye, H.A.; Purushothaman, S.; Rathore, H.A.; Seo, S.C.; Shaw, T.M.; Simon, A.H.; Spooner, T.A.; Stetter, M.; Wachnik, R.A.; Ryan, J.G.
Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407) Interconnect technology Interconnect Technology Conference, 2000. Proceedings of the IEEE 2000 International. :261-263 2000
Academic Journal
Faltermeier, C.G.; Goldberg, C.; Jones, M.; Upham, A.; Knorr, A.; Ivanova, A.; Peterson, G.; Kaloyeros, A.E.; Arkles, B.
In: Journal of the Electrochemical Society . (Journal of the Electrochemical Society, February 1998, 145(2):676-683)
Conference
Goldblatt, R.D.; Agarwala, B.; Anand, M.B.; Barth, E.P.; Biery, G.A.; Chen, Z.G.; Cohen, S.; Connolly, J.B.; Cowley, A.; Dalton, T.; Das, S.K.; Davis, C.R.; Deutsch, A.; DeWan, C.; Edelstein, D.C.; Emmi, P.A.; Faltermeier, C.G.; Fitzsimmons, J.A.; Hedrick, J.; Heidenreich, J.E.
Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407); 2000, p261-263, 3p
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제한된 항목
[AR] Faltermeier, C.G.
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