학술논문
'학술논문'
에서 검색결과 128건 | 목록
1~10
Academic Journal
Augur, R.; Child, C.; Ahn, J.H.; Tang, T.J.; Clevenger, L.; Kioussis, D.; Masuda, H.; Srivastava, R.; Oda, Y.; Oguma, H.; Quon, R.; Kim, B.; Sheng, H.; Hirooka, S.; Gupta, R.; Thomas, A.; Singh, S.M.; Fang, Q.; Schiwon, R.; Hamieh, B.; Wornyo, E.; Allen, S.; Kaltalioglu, E.; Ribes, G.; Zhang, G.; Fryxell, T.; Ogino, A.; Shimada, E.; Aizawa, H.; Minda, H.; Kim, S.O.; Oki, T.; Fujii, K.; Pallachalil, M.; Takewaki, T.; Hu, C.K.; Sundlof, B.; Permana, D.; Bolom, T.; Engel, B.; Labelle, C.; Sapp, B.; Nogami, T.; Simon, A.; Shobha, H.; Gates, S.; Ryan, E.T.; Bonilla, G.; Daubenspeck, T.; Shaw, T.; Osborne, G.; Grill, A.; Edelstein, D.; Restaino, D.; Molis, S.; Spooner, T.; Ferreira, P.; Biery, G.; Sampson, R.
In Microelectronic Engineering April 2012 92:42-44
Conference
Yang, C.-C.; Spooner, T.; McLaughlin, P.; Hu, C.K.; Huang, H.; Mignot, Y.; Ali, M.; Lian, G.; Quon, R.; Standaert, T.; Edelstein, D.
2017 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2017 IEEE International. :1-3 May, 2017
Academic Journal
In: Cell Reports . (Cell Reports, 15 February 2022, 38(7))
Conference
Yang, C.-C.; Spooner, T.; Wang, W.; Maniscalco, J.; McLaughlin, P.; Hu, C.K.; Liniger, E.; Standaert, T.; Canaperi, D.; Quon, R.; Huang, E.; Edelstein, D.
2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC) Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2016 IEEE International. :89-91 May, 2016
Conference
Priyadarshini, Deepika; Nguyen, S.; Shobha, H.; Cohen, S.; Shaw, T.; Parks, C.; Adams, E.; Burnham, J.; Liniger, E.; Hu, C.K.; Collins, D.; Spooner, T.; Grill, A.; Canaperi, D.; Paruchuri, Vamsi; Edelstein, D.
2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC) Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2016 IEEE International. :92-94 May, 2016
Conference
Priyadarshini, Deepika; Nguyen, S.; Shobha, H.; Cohen, S.; Shaw, T.; Liniger, E.; Hu, C.K.; Parks, C.; Adams, E.; Burnham, J.; Simon, A.H.; Bonilla, G.; Grill, A.; Canaperi, D.; Edelstein, D.; Collins, D.; Balseanu, M.; Stolfi, M.; Ren, J.; Shah, K.
IEEE International Interconnect Technology Conference Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2014 IEEE International. :185-188 May, 2014
Academic Journal
Pathak, K.V.; McGilvrey, M.I.; Garcia-Mansfield, K.; Pirrotte, P.; Lewandoski, K.; Zenhausern, F.; Hu, C.K.; Menashi, E.; Eftekhari, Z.; Yuan, Y.-C.
In: Molecular and Cellular Proteomics . (Molecular and Cellular Proteomics, 1 October 2020, 19(10):1688-1705)
Conference
Nitta, S.; Purushothaman, S.; Smith, S.; Krishnan, M.; Canaperi, D.; Dalton, T.; Volksen, W.; Miller, R.D.; Herbst, B.; Hu, C.K.; Liniger, E.; Lloyd, J.; Lane, M.; Rath, D.L.; Colburn, M.; Gignac, L.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :321-324 2004
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 16(4):446-451 Dec, 2016
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제한된 항목
[AR] Hu, C.K.
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