학술논문
'학술논문'
에서 검색결과 43건 | 목록
1~10
Academic Journal
Fadlallah, M.; Szewczyk, A.; Giannakopoulos, C.; Cretu, B.; Monsieur, F.; Devoivre, T.; Jomaah, J.; Ghibaudo, G.
In Microelectronics Reliability 2001 41(9):1361-1366
Conference
Difrenza, R.; Rochereau, K.; Devoivre, T.; Tavel, B.; Duriez, B.; Roy, D.; Jullian, S.; Dezzani, A.; Boulestin, R.; Stolk, P.; Arnaud, F.
Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :137-142 2005
Conference
Devoivre, T.; Lunenborg, M.; Julien, C.; Carrere, J.-P.; Ferreira, P.; Toren, W.J.; VandeGoor, A.; Gayet, P.; Berger, T.; Hinsinger, O.; Vannier, P.; Trouiller, Y.; Rody, Y.; Goirand, P.-J.; Palla, R.; Thomas, I.; Guyader, F.; Roy, D.; Borot, B.; Planes, N.; Naudet, S.; Pico, F.; Duca, D.; Lalanne, F.; Heslinga, D.; Haond, M.
Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) Memory technology design and testing Memory Technology, Design and Testing, 2002. (MTDT 2002). Proceedings of the 2002 IEEE International Workshop on. :157-162 2002
Conference
29th European Solid-State Device Research Conference Solid-State Device Research Conference, 1999. Proceeding of the 29th European. 1:420-423 1999
Conference
ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) Microelectronic test structures Microelectronic Test Structures, 1999. ICMTS 1999. Proceedings of the 1999 International Conference on. :111-116 1999
Conference
IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168) Semiconductor manufacturing Advanced Semiconductor Manufacturing Conference and Workshop, 1998. 1998 IEEE/SEMI. :434-438 1998
Conference
28th European Solid-State Device Research Conference Solid-State Device Research Conference, 1998. Proceeding of the 28th European. :152-155 1998
Conference
Morin, P.; Cacho, F.; Beneyton, R.; Dumont, B.; Bidaud, M.; Josse, E.; Gallon, C.; Ranica, R.; Villaret, A.; Bianchini, R.; Devoivre, T.; Serret, E.; Binger, R.; Barla, K.; Haond, M.; Colin, A.; Bono, H.; Chaton, C.
2009 Proceedings of the European Solid State Device Research Conference Solid State Device Research Conference, 2009. ESSDERC '09. Proceedings of the European. :288-291 Sep, 2009
Improved method for the oxide thickness extraction in MOS structures with ultrathin gate dielectrics
Academic Journal
IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 13(2):152-158 May, 2000
Conference
Arnaud, F.; Duriez, B.; Tavel, B.; Pain, L.; Todeschini, J.; Jurdit, M.; Laplanche, Y.; Boeuf, F.; Salvetti, F.; Lenoble, D.; Reynard, J.P.; Wacquant, F.; Morin, P.; Emonet, N.; Barge, D.; Bidaud, M.; Ceccarelli, D.; Vannier, P.; Loquet, Y.; Leninger, H.; Judong, F.; Perrot, C.; Guilmeau, I.; Palla, R.; Beverina, A.; DeJonghe, V.; Broekaart, M.; Vachellerie, V.; Bianchi, R.A.; Borot, B.; Devoivre, T.; Bicais, N.; Roy, D.; Denais, M.; Rochereau, K.; Difrenza, R.; Planes, N.; Brut, H.; Vishnobulta, L.; Reber, D.; Stolk, P.; Woo, M.
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. VLSI technology VLSI Technology, 2004. Digest of Technical Papers. 2004 Symposium on. :10-11 2004
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[AR] Devoivre, T.
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