학술논문
'학술논문'
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Bédécarrats, T.; Paz, B. Cardoso; Diaz, B. Martinez; Niebojewski, H.; Bertrand1, B.; Rambal, N.; Comboroure, C.; Sarrazin, A.; Boulard, F.; Guyez, E.; Hartmann, J. -M.; Morand, Y.; Magalhaes-Lucas, A.; Nowak, E.; Catapano, E.; Cassé, M.; Urdampilleta, M.; Niquet, Y. -M.; Gaillard, F.; De Franceschi, S.; Meunier, T.; Vinet, M.
2021 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 2021, pp. 1-4
Conference
Bedecarrats, T.; Paz, B. Cardoso; Diaz, B. Martinez; Niebojewski, H.; Bertrand, B.; Rambal, N.; Comboroure, C.; Sarrazin, A.; Boulard, F.; Guyez, E.; Hartmann, J.-M.; Morand, Y.; Magalhaes-Lucas, A.; Nowak, E.; Catapano, E.; Casse, M.; Urdampilleta, M.; Niquet, Y.-M.; Gaillard, F.; De Franceschi, S.; Meunier, T.; Vinet, M.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :1-4 Dec, 2021
Academic Journal
Coquand, R.; Barraud, S.; Cassé, M.; Leroux, P.; Vizioz, C.; Comboroure, C.; Perreau, P.; Ernst, E.; Samson, M.-P.; Maffini-Alvaro, V.; Tabone, C.; Barnola, S.; Munteanu, D.; Ghibaudo, G.; Monfray, S.; Boeuf, F.; Poiroux, T.
In Solid State Electronics October 2013 88:32-36
Academic Journal
Koyama, M.; Cassé, M.; Coquand, R.; Barraud, S.; Vizioz, C.; Comboroure, C.; Perreau, P.; Maffini-Alvaro, V.; Tabone, C.; Tosti, L.; Barnola, S.; Delaye, V.; Aussenac, F.; Ghibaudo, G.; Iwai, H.; Reimbold, G.
In Solid State Electronics June 2013 84:46-52
Academic Journal
In Microelectronic Engineering May-June 2008 85(5-6):800-804
Conference
Masoero, L.; Molas, G.; Della Marca, V.; Gely, M.; Cueto, O.; Colonna, J. P.; De Luca, A.; Brianceau, P.; Charpin, C.; Lafond, D.; Delaye, V.; Aussenac, F.; Carabasse, C.; Pauliac, S.; Comboroure, C.; Boivin, P.; Ghibaudo, G.; Deleonibus, S.; De Salvo, B.
2012 4th IEEE International Memory Workshop Memory Workshop (IMW), 2012 4th IEEE International. :1-4 May, 2012
Conference
Coquand, R.; Barraud, S.; Casse, M.; Leroux, P.; Vizioz, C.; Comboroure, C.; Perreau, P.; Ernst, E.; Samson, M.-P.; Maffini-Alvaro, V.; Tabone, C.; Barnola, S.; Munteanu, D.; Ghibaudo, G.; Monfray, S.; Boeuf, F.; Poiroux, T.
2012 13th International Conference on Ultimate Integration on Silicon (ULIS) Ultimate Integration on Silicon (ULIS), 2012 13th International Conference on. :37-40 Mar, 2012
Conference
Batude, P.; Brunet, L.; Fenouillet-Beranger, C.; Andrieu, F.; Colinge, J.-P.; Lattard, D.; Vianello, E.; Thuries, S.; Billoint, O.; Vivet, P.; Santos, C.; Mathieu, B.; Sklenard, B.; Lu, C.-M. V.; Micout, J.; Deprat, F.; Mercado, E. Avelar; Ponthenier, F.; Rambal, N.; Samson, M.-P.; Casse, M.; Hentz, S.; Arcamone, J.; Sicard, G.; Hutin, L.; Pasini, L.; Ayres, A.; Rozeau, O.; Berthelon, R.; Nemouchi, F.; Rodriguez, P.; Pin, J.-B.; Larmagnac, D.; Duboust, A.; Ripoche, V.; Barraud, S.; Allouti, N.; Barnola, S.; Vizioz, C.; Hartmann, J.-M.; Kerdiles, S.; Alba, P. Acosta; Beaurepaire, S.; Beugin, V.; Fournel, F.; Besson, P.; Loup, V.; Gassilloud, R.; Martin, F.; Garros, X.; Mazen, F.; Previtali, B.; Euvrard-Colnat, C.; Balan, V.; Comboroure, C.; Zussy, M.; Mazzocchi; Faynot, O.; Vinet, M.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :3.1.1-3.1.4 Dec, 2017
Conference
Barraud, S.; Lapras, V.; Previtali, B.; Samson, M. P.; Lacord, J.; Martinie, S.; Jaud, M.-A.; Athanasiou, S.; Triozon, F.; Rozeau, O.; Hartmann, J. M.; Vizioz, C.; Comboroure, C.; Andrieu, F.; Barbe, J. C.; Vinet, M.; Ernst, T.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :29.2.1-29.2.4 Dec, 2017
Conference
Micout, J.; Lapras, V.; Batude, P.; Fenouillet-Beranger, C.; Lacord, J.; Sklenard, B.; Mathieu, B.; Rafhay, Q.; Mazzocchi, V.; Colinge, J.-P.; Lachal, L.; Garros, X.; Casse, M.; Toffoli, A.; Romano, G.; Allain, F.; Brunet, L.; Hartmann, J.-M.; Bortolin, R.; Mazen, F.; Barraud, S.; Rambal, N.; Tabone, C.; Samson, M.-P.; Besombes, P.; Delaye, V.; Saghi, Z.; Loup, V.; Comboroure, C.; Balan, V.; Desvoivres, L.; Vizioz, C.; Ghibaudo, G.; Vinet, M.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :32.2.1-32.2.4 Dec, 2017
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[AR] Comboroure, C.
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