학술논문
'학술논문'
에서 검색결과 23건 | 목록
1~10
Conference
Alcala, R.; Materano, M.; Lomenzo, P.D.; Grenouillet, L.; Francois, T.; Coignus, J.; Vaxelaire, N.; Carabasse, C.; Chevalliez, S.; Andrieu, F.; Mikolajick, T.; Schroeder, U.
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2022 6th IEEE. :67-69 Mar, 2022
Conference
Fenouillet-Beranger, C.; Brunet, L.; Batude, P.; Andrieu, F.; Micout, J.; Previtali, B.; Pedini, J-M.; Mazzocchi, V.; Acosta-Alba, P.; Kerdiles, S.; Beugin, V.; Guerin, C.; Vizioz, C.; Ponthenier, F.; Rambal, N.; Casse, M.; Garros, X.; Chevalliez, S.; Aussenac, F.; Vinet, M.
2019 Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2019. :249-251 Mar, 2019
Conference
Grenouillet, L.; Francois, T.; Coignus, J.; Kerdiles, S.; Vaxelaire, N.; Carabasse, C.; Mehmood, F.; Chevalliez, S.; Pellissier, C.; Triozon, F.; Mazen, F.; Rodriguez, G.; Magis, T.; Havel, V.; Slesazeck, S.; Gaillard, F.; Schroeder, U.; Mikolajick, T.; Nowak, E.
2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
Conference
Brunet, L.; Fenouillet-Beranger, C.; Batude, P.; Beaurepaire, S.; Ponthenier, F.; Rambal, N.; Mazzocchi, V.; Pin, J-B.; Acosta-Alba, P.; Kerdiles, S.; Besson, P.; Fontaine, H.; Lardin, T.; Fournel, F.; Larrey, V.; Mazen, F.; Balan, V.; Morales, C.; Guerin, C.; Jousseaume, V.; Federspiel, X.; Ney, D.; Garros, X.; Roman, A.; Scevola, D.; Perreau, P.; Kouemeni-Tchouake, F.; Arnaud, L.; Scibetta, C.; Chevalliez, S.; Aussenac, F.; Aubin, J.; Reboh, S.; Andrieu, F.; Maitrejean, S.; Vinet, M.
2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :7.2.1-7.2.4 Dec, 2018
Conference
Verdy, A.; Navarro, G.; Bernard, M.; Chevalliez, S.; Castellani, N.; Nolot, E.; Garrione, J.; Noe, P.; Bourgeois, G.; Sousa, V.; Cyrille, M.-C.; Nowak, E.
2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :6D.4-1-6D.4-6 Mar, 2018
Conference
Barlas, M.; Grossi, A.; Grenouillet, L.; Vianello, E.; Nolot, E.; Vaxelaire, N.; Blaise, P.; Traore, B.; Coignus, J.; Perrin, F.; Crochemore, R.; Mazen, F.; Lachal, L.; Pauliac, S.; Pellissier, C.; Bernasconi, S.; Chevalliez, S.; Nodin, J. F.; Perniola, L.; Nowak, E.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :14.6.1-14.6.4 Dec, 2017
Academic Journal
Francois, T.; Grenouillet, L.; Coignus, J.; Vaxelaire, N.; Carabasse, C.; Aussenac, F.; Chevalliez, S.; Gaillard, F.; Nowak, E.; Chiquet, P.; Bocquet, M.; Slesazeck, S.; Richter, C.; Schroeder, U.; Mikolajick, T.
In: Applied Physics Letters . (Applied Physics Letters, 8 February 2021, 118(6))
Academic Journal
Francois, T.; Grenouillet, L.; Coignus, J.; Vaxelaire, N.; Carabasse, C.; Aussenac, F.; Chevalliez, S.; Slesazeck, S.; Richter, C.; Chiquet, P.; Bocquet, M.; Schroeder, U.; Mikolajick, T.; Gaillard, F.; Nowak, E.
Applied Physics Letters; 2021, Vol. 118 Issue 6, p1-5, 5p
Academic Journal
Conference
Barlas, M.; Grossi, A.; Grenouillet, L.; Vianello, E.; Nolot, E.; Vaxelaire, N.; Blaise, P.; Traoré, B.; Coignus, J.; Perrin, F.; Crochemore, R.; Mazen, F.; Lachal, L.; Pauliac, S.; Pellissier, C.; Bernasconi, S.; Chevalliez, S.; Nodin, J.F.; Perniola, L.; Nowak, E.
In: Technical Digest - International Electron Devices Meeting, IEDM , 2017 IEEE International Electron Devices Meeting, IEDM 2017. (Technical Digest - International Electron Devices Meeting, IEDM, 23 January 2018, :14.6.1-14.6.4)
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[AR] Chevalliez, S.
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