학술논문
'학술논문'
에서 검색결과 66건 | 목록
10~20
Conference
Soltani, E.; Le-Gratie, B.; Bange, R.; Berard-Berger, S.; Pradelles, J.; Tiron, R.; Schuch, N.; Figueiro, T.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12053)
Conference
Sezestre, E.; Scoarnec, J.; Pradelles, J.; Perraud, L.; Fay, A.; Bergery, S.B.; Bustos, J.; Henry, J.-B.; Dubreuil, O.; Mendes, I.; Valade, C.; Moly, A.; Batte, A.; Schuch, N.; Robert, F.; Figueiro, T.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12053)
Academic Journal
In: Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics . (Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, 1 September 2016, 34(5))
Academic Journal
Maret, M.; Tiron, R.; Gergaud, P.; Gharbi, A.; Lapeyre, C.; Pradelles, J.; Jousseaume, V.; Chevalier, X.; Navarro, C.; Fleury, G.; Hadziioannou, G.; Boudet, N.
In: Macromolecules . (Macromolecules, 28 October 2014, 47(20):7221-7229)
Conference
Pradelles, J.; Perraud, L.; Fay, A.; Henry, J.-B.; Bustos, J.; Guyez, E.; Berard-Bergery, S.; Le Pennec, A.; Sezestre, E.; Abaidi, M.; Belissard, J.; Schuch, N.; Millequant, M.; Figueiro, T.; Schiavone, P.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2021, 11611)
Conference
Abaidi, M.; Belissard, J.; Schuch, N.; Figueiro, T.; Millequant, M.; Schiavone, P.; Pradelles, J.; Perraud, L.; Fay, A.; Bustos, J.; Henry, J.-B.; Guyez, E.; Berard-Bergery, S.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2021, 11611)
Periodical
Engelmann, Sebastian U.; Wise, Rich S.; Landis, S.; Teyssedre, H.; Claveau, G.; Servin, I.; Delachat, F.; Pourteau, M. L.; Gharbi, A.; Pimenta Barros, P.; Tiron, R.; Nouri, L.; Possemé, N.; May, M.; Brianceau, P.; Barnola, S.; Blancquaert, Y.; Pradelles, J.; Essomba, P.; Bernadac, A.; Dal'zotto, B.; Bos, S.; Argoud, M.; Chamiot-Maitral, G.; Sarrazin, A.; Tallaron, C.; Lapeyre, C.; Pain, L.
Proceedings of SPIE; April 2017, Vol. 10149 Issue: 1 p101490K-101490K-13, 10047524p
Academic Journal
Chevalier, X.; Nicolet, C.; Navarro, C.; Tiron, R.; Gharbi, A.; Argoud, M.; Pradelles, J.; Fleury, G.; Hadziioannou, G.; Delalande, M.; Cunge, G.
In: Journal of Micro/Nanolithography, MEMS, and MOEMS . (Journal of Micro/Nanolithography, MEMS, and MOEMS, July/September 2013, 12(3))
Academic Journal
Tiron, R.; Chevalier, X.; Couderc, C.; Pradelles, J.; Bustos, J.; Pain, L.; Navarro, C.; Magnet, S.; Fleury, G.; Hadziioannou, G.
In: Journal of Vacuum Science and Technology B . (Journal of Vacuum Science and Technology B, November 2011, 29(6))
Conference
Proceedings of SPIE; Nov2009 Part 3, Issue 1, p74700R-74700R-12, 12p
검색 결과 제한하기
제한된 항목
[AR] Pradelles, J.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어