학술논문
'학술논문'
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Conference
Pedreira, O. Varela; Stucchi, M.; Gupta, A.; Gonzalez, V. Vega; van der Veen, M.; Lariviere, S.; Wilson, C.J.; Tokei, Zs; imec, K. Croes
2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-7 Apr, 2020
Academic Journal
In Microelectronic Engineering 2003 65(1):123-131
Dependence of the minimal PVD TA(N) sealing thickness on the porosity of Zirkon™ LK dielectric films
Academic Journal
Iacopi, F ; Zistl, C; Jehoul, C; Tokei, Zs; Le, Q.T; Das, A; Sullivan, C; Prokopowicz, G; Gronbeck, D; Gallagher, M; Calvert, J; Maex, K
In Microelectronic Engineering 2002 64(1):351-360
Academic Journal
In Applied Surface Science 2000 162:208-212
Book
Microscopy of Semiconducting Materials; 2005, p347-350, 4p
Academic Journal
Academic Journal
Tang, B. J.; Croes, K.; Barbarin, Y.; Wang, Y. Q.; Degraeve, R.; Li, Y.; Toledano-Luque, M.; Kauerauf, T.; Boemmels, J.; Tokei, Zs; De Wolf, I.
Academic Journal
Vanstreels, K.; Czarnecki, P.; Kirimura, T.; Siew, Y. K.; De Wolf, I.; Bommels, J.; Tokei, Zs; Croes, K.
Academic Journal
Wilson, C. J.; Croes, K.; Van Cauwenberghe, M.; Tokei, Zs; Beyer, G. P.; Horsfall, A. B.; O'Neill, A. G.
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[AR] Tokei, Zs
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