학술논문
'학술논문'
에서 검색결과 20건 | 목록
1~10
Conference
Liu, L.; Santermans, S.; Barge, D.; Delport, J.; Chaudhuri, A. Ray; Willems, K.; Ha, S.; Severi, S.; Van Dorpe, P.; Martens, K.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Academic Journal
IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 70(11):4323-4333 Nov, 2023
Surface Charge Modulation and Reduction of Non-Linear Electrolytic Screening in FET-Based Biosensing
Academic Journal
IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 21(4):4143-4151 Feb, 2021
Conference
Wuytens, R.; Santermans, S.; Gupta, M.; Bois, B. Du; Severi, S.; Lagae, L.; Roy, W. Van; Martens, K. M.
2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-5 Apr, 2020
Academic Journal
Gupta, M.; Santermans, S.; Bois, B.D.; Vos, R.; Severi, S.; Hellings, G.; Lagae, L.; Martens, K.; Van Roy, W.
IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 20(16):8956-8964 Aug, 2020
Academic Journal
Gupta, M.; Santermans, S.; Veloso, A.; Tao, Z.; Li, W.; Hellings, G.; Lagae, L.; Van Roy, W.; Martens, K.
IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 19(16):6578-6586 Aug, 2019
Academic Journal
In: Nanoscale . (Nanoscale, 16 January 2023, 15(5):2354-2368)
Conference
Santermans, S.; Barge, D.; Hellings, G.; Mori, C.B.; Migacz, K.J.; Rip, J.; Spampinato, V.; Vos, R.; Bois, B. Du; Chaudhuri, A.R.; Martino, J.A.; Heyns, M.; Severi, S.; Van Roy, W.; Martens, K.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :35.4.1-35.4.4 Dec, 2020
Conference
Martens, K.; Santermans, S.; Gupta, M.; Hellings, G.; Wuytens, R.; Du Bois, B.; Dupuy, E.; Altamirano-Sanchez, E.; Jans, K.; Vos, R.; Stakenborg, T.; Lagae, L.; Heyns, M.; Severi, S.; Roy, W. Van
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :18.6.1-18.6.4 Dec, 2019
Academic Journal
In: ACS Sensors . (ACS Sensors, 26 March 2021, 6(3):1049-1056)
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제한된 항목
[AR] Santermans, S.
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