학술논문
'학술논문'
에서 검색결과 10건 | 목록
1~10
Conference
2022 IEEE International Test Conference India (ITC India) Test Conference India (ITC India), 2022 IEEE International. :1-5 Jul, 2022
Conference
Ricchetti, Mike; Rentschler, Eric; Majumdar, Amit; Lowe, Mike; LaVine, Mark; Lindsey, Skip; Kumar, Sharad
2016 IEEE 34th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2016 IEEE 34th. :1-1 Apr, 2016
Conference
2015 IEEE 33rd VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2015 IEEE 33rd. :1-1 Apr, 2015
Conference
In: Proceedings of the IEEE VLSI Test Symposium . (Proceedings of the IEEE VLSI Test Symposium, 2000, :473)
Academic Journal
IEEE Design & Test of Computers; May/Jun2003, Vol. 20 Issue 3, p78-87, 10p, 2 Black and White Photographs, 6 Diagrams
Academic Journal
Marinissen, Erik; Kapur, Rohit; Lousberg, Maurice; McLaurin, Teresa; Ricchetti, Mike; Zorian, Yervant
Journal of Electronic Testing; Aug2002, Vol. 18 Issue 4/5, p365-383, 19p
Academic Journal
Conference
In: IEEE International Test Conference (TC) . (IEEE International Test Conference (TC), 1998, :980-989)
Conference
In: Digest of Papers - International Test Conference . (Digest of Papers - International Test Conference, 1988, :987-992)
Periodical
Test & Measurement World. June, 2004, Vol. 24 Issue 5, p23, 1 p.
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제한된 항목
[AR] Ricchetti, Mike
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