학술논문

EBSCO Discovery Service
발행년
-
(예 : 2010-2015)
'학술논문' 에서 검색결과 10건 | 목록 1~10
Conference
2022 IEEE International Test Conference India (ITC India) Test Conference India (ITC India), 2022 IEEE International. :1-5 Jul, 2022
Conference
2016 IEEE 34th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2016 IEEE 34th. :1-1 Apr, 2016
Conference
2015 IEEE 33rd VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2015 IEEE 33rd. :1-1 Apr, 2015
Conference
In: Proceedings of the IEEE VLSI Test Symposium. (Proceedings of the IEEE VLSI Test Symposium, 2000, :473)
Academic Journal
IEEE Design & Test of Computers; May/Jun2003, Vol. 20 Issue 3, p78-87, 10p, 2 Black and White Photographs, 6 Diagrams
Conference
In: IEEE International Test Conference (TC). (IEEE International Test Conference (TC), 1998, :980-989)
Conference
In: Digest of Papers - International Test Conference. (Digest of Papers - International Test Conference, 1988, :987-992)
Periodical
Test & Measurement World. June, 2004, Vol. 24 Issue 5, p23, 1 p.
검색 결과 제한하기
제한된 항목
[AR] Ricchetti, Mike
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어