학술논문

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발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 55건 | 목록 1~20
Conference
2014 IEEE 23rd Asian Test Symposium Test Symposium (ATS), 2014 IEEE 23rd Asian. :269-274 Nov, 2014
Conference
2014 International Test Conference Test Conference (ITC), 2014 IEEE International. :1-10 Oct, 2014
Conference
2013 22nd Asian Test Symposium Test Symposium (ATS), 2013 22nd Asian. :147-152 Nov, 2013
Conference
2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC) Design Automation Conference (DAC), 2013 50th ACM/EDAC/IEEE. :1-6 May, 2013
Conference
2012 IEEE International Test Conference Test Conference (ITC), 2012 IEEE International. :1-10 Nov, 2012
Conference
2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012. :793-798 Mar, 2012
Conference
17th Asia and South Pacific Design Automation Conference Design Automation Conference (ASP-DAC), 2012 17th Asia and South Pacific. :731-737 Jan, 2012
Academic Journal
IEEE Design & Test of Computers IEEE Des. Test. Comput. Design & Test of Computers, IEEE. 28(6):85-87 Jan, 2011
Conference
2008 IEEE International Test Conference Test Conference, 2008. ITC 2008. IEEE International. :1-1 Oct, 2008
Conference
2008 IEEE International Test Conference Test Conference, 2008. ITC 2008. IEEE International. :1-6 Oct, 2008
Conference
2007 IEEE International Test Conference Test Conference, 2007. ITC 2007. IEEE International. :1-1 Oct, 2007
Conference
2015 IEEE 33rd VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2015 IEEE 33rd. :1-1 Apr, 2015
Conference
2012 17th IEEE European Test Symposium (ETS) Test Symposium (ETS), 2012 17th IEEE European. :1-1 May, 2012
Academic Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Feb2016, Vol. 35 Issue 2, p309-322. 14p.
Conference
DAC: Annual ACM/IEEE Design Automation Conference; Jun2013, p1-6, 6p
Academic Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Sep2014, Vol. 33 Issue 9, p1410-1423. 14p.
Academic Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Apr2013, Vol. 32 Issue 4, p559-571. 13p.
Academic Journal
IEEE Design & Test of Computers; Sep/Oct2003, Vol. 20 Issue 5, p76-83, 8p, 3 Black and White Photographs, 7 Diagrams
Conference
Proceedings of the conference on Design, automation and test in Europe - Volume 2. :21184
Conference
Proceedings of the conference on Design, automation and test in Europe - Volume 3. :30006
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제한된 항목
[AR] Eklow, Bill
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