학술논문
'학술논문'
에서 검색결과 43건 | 목록
1~10
Academic Journal
Pantisano, Luigi; Srinivasan, Purushothaman; Kim, Taehoon; Chu, Tao; Ozbek, Merve; Zainuddin, Abu Naser; Hasanuzzaman, M.; Dag, Sefa; Paliwoda, P.; Bajaj, M.; Kannan, Balaji; Kota, Murali; Zhao, Kai
In Microelectronic Engineering 25 June 2017 178:258-261
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(5):2579-2584 May, 2022
Conference
Toledano-Luque, M.; Paliwoda, P.; Nour, M.; Kauerauf, T.; Min, B.; Bossu, G.; Siddabathula, M.; Nigam, T.
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-6 Mar, 2021
Conference
Paliwoda, P.; Toledano-Luque, M.; Nigam, T.; Guarin, F.; Nour, M.; Cimino, S.; Pantisano, L.; Gupta, A.; Gonzalez, O. H.; Hauser, M.; Liu, W.; Vayshenker, A.; Ioannou, D.; Lee, D.; Jiang, L.; Yee, P.; Rauch, S.; Min, B.
2020 IEEE 29th North Atlantic Test Workshop (NATW) North Atlantic Test Workshop (NATW), 2020 IEEE 29th. :1-7 Jun, 2020
Conference
Paliwoda, P.; Rabie, M.A.; Restrepo, O.D.; Silva, E.C.; Kaltalioglu, E.; Guarin, F.; Barnett, K.; Johnson, J.; Taylor, W.; Boenke, M.; Min, B.
2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-5 Apr, 2020
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 20(2):230-241 Jun, 2020
Conference
Toledano-Luque, M.; Srinivasan, P.; Paliwoda, P.; Cimino, S.; Chbili, Z.; Mahmud, M.I.; Gupta, A.; Shen, T.; Kauerauf, T.; Zhu, B.; Min, B.; Nigam, T.
2019 Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2019. :218-221 Mar, 2019
Conference
Paliwoda, P.; Chbili, Z.; Kerber, A.; Nigam, T.; Singh, D.; Nagahiro, K.; Manik, P.P; Cimino, S.; Misra, D.
2018 International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2018 International. :01-04 Oct, 2018
Academic Journal
Paliwoda, P.; Chbili, Z.; Kerber, A.; Nigam, T.; Nagahiro, K.; Cimino, S.; Toledano-Luque, M.; Pantisano, L.; Min, B.W.; Misra, D.
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 19(2):249-254 Jun, 2019
Conference
2018 International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2018 International. :1-3 Oct, 2018
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[AR] Paliwoda, P.
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