학술논문
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Academic Journal
In Microelectronics Journal December 2014 45(12):1726-1733
Academic Journal
In International Journal of Mass Spectrometry 2008 278(1):69-74
Academic Journal
In International Journal of Mass Spectrometry 2007 261(2):192-198
Academic Journal
Rascol, O.; Tönges, L.; deVries, T.; Jaros, M.; Jacobs, D.; Quartel, A.; Azulay, J.-P.; Balaguer, E.; Bhatia, P.; Bodis-Wollner, I.; Brownstone, P.; Boulloche, N.; Calegan, G.J.; Castelnovo, G.; Chou, K.L.; Corvol, J.-C.; Danisi, F.; Defebvre, L.; Desojo, L.V.; Durif, F.; Ehret, R.; Evans, B.K.; Forchetti, C.; Friedman, J.H.; Fogel, W.; Garniga, M.C.; Gil, R.A.; Ginsberg, P.L.; Glasberg, M.R.; Griffith, A.; Groves, J.W.; Gudesblatt, M.; Hermanowicz, N.; Herrera, M.A.; Houeto, J.-L.; Hutchman, R.M.; Isaacson, S.H.; Jagadeesan, S.; Jog, M.; Keegan, A.; Klostermann, F.; Krystkowiak, P.; Kulisevsky Bojarsky, J.; Kumar, R.; Lacey, D.; Lasker, B.; LaVaccare, J.; Lavallee, M.M.; Piudo, M.R.L.; Mahler, A.; Domenech, M.J.M.; Martinez Castrillo, J.C.; Mate, L.J.; Mendis, T.; Metman, L.V.; Muhlack, S.M.; Müller, T.; Park, A.; Patton, J.; Peckham, E.; Grandas Pérez, F.; Rabin, M.; Reifschneider, G.; Remy, P.; Rivera, P.M.; Schwarz, J.; Roullet-Solignac, I.; Salazar, G.; Sergay, S.M.; Sherman, S.; Shubin, R.; Spikol, L.; Steigerwald, F.; Truong, D.D.; Ugarte, A.; Vivancos Matellano, F.; Witte, A.; Zesiewicz, T.; Zauber, S.E.
In: Parkinsonism and Related Disorders . (Parkinsonism and Related Disorders, March 2022, 96:65-73)
Conference
20th International Workshop on Thermal Investigations of ICs and Systems Thermal Investigations of ICs and Systems (THERMINIC), 2014 20th International Workshop on. :1-6 Sep, 2014
Conference
19th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) Thermal Investigations of ICs and Systems (THERMINIC), 2013 19th International Workshop on. :181-187 Sep, 2013
Academic Journal
In: iScience . (iScience, 20 November 2020, 23(11))
Conference
Gusev, E.P.; Cabral, C., Jr.; Under, B.P.; Kim, Y.H.; Maitra, K.; Carrier, E.; Nayfeh, H.; Amos, R.; Biery, G.; Bojarczuk, N.; Callegari, A.; Carruthers, R.; Cohen, S.A.; Copel, M.; Fang, S.; Frank, M.; Guha, S.; Gribelyuk, M.; Jamison, P.; Jammy, R.; Ieong, M.; Kedzierski, J.; Kozlowski, P.; Ku, K.; Lacey, D.; LaTulipe, D.; Narayanan, V.; Ng, H.; Nguyen, P.; Newbury, J.; Paruchuri, V.; Rengarajan, R.; Shahidi, G.; Steegen, A.; Steen, M.; Zafar, S.; Zhang, Y.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :79-82 2004
Conference
Callegari, A.; Jamison, P.; Carrier, E.; Zafar, S.; Gusev, E.; Narayanan, V.; D'Emic, C.; Lacey, D.; Feely, F.M.; Jammy, R.; Gribelyuk, M.; Shepard, J.; Andreoni, W.; Curioni, A.; Pignedoli, C.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :825-828 2004
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[AR] Lacey, D.
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