학술논문 – 부산대학교 도서관

학술논문

replay검색결과 돌아가기

search검색화면

Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs

Document Type

Article

Author

Bernardi, P.; Guerriero, A.M.; Insinga, G.; Paganini, G.; Carnevale, G.; Coppetta, M.; Mischo, W.; Ullmann, R.

Source

In: Electronics (Switzerland). (Electronics (Switzerland), January 2024, 13(2))

Subject

Language

English

ISSN

20799292

Online Access

Full Text (Gale Academic Onefile) Full Text (ProQuest Central) Open Access (EBSCO) Web of Science JCR 저널정보 Scopus Find it@PNU

이메일