학술논문
'학술논문'
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1~10
Conference
Insinga, G.; Battilana, M.; Coppetta, M.; Mautone, N.; Carnevale, G.; Giltrelli, M.; Scaramuzza, P.; Ullmann, R.
2023 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2023 IEEE. :1-6 May, 2023
Conference
Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A.M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Reorda, M.S.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.
2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2022 IEEE 28th International Symposium on. :1-10 Sep, 2022
Conference
Bernardi, P.; Insinga, G.; Paganini, G.; Cantoro, R.; Beer, P.; Coppetta, M.; Mautone, N.; Carnevale, G.; Scaramuzza, P.; Ullmann, R.
2022 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2022 IEEE European. :1-6 May, 2022
Academic Journal
Barbarino, M.; Pesetti, M.; Bottaro, M.; Tomassetti, C.; Insinga, G.; Burk, S.; Giordano, A.; Bellan, C.; Arcuri, F.; Paladini, P.; Graziano, A.
In: Instrumentation Science and Technology . (Instrumentation Science and Technology, 2024)
Academic Journal
Bernardi, P.; Guerriero, A.M.; Insinga, G.; Paganini, G.; Carnevale, G.; Coppetta, M.; Mischo, W.; Ullmann, R.
In: Electronics (Switzerland) . (Electronics (Switzerland), January 2024, 13(2))
Conference
Abbati, L. Degli; Ullmann, R.; Paganini, G.; Coppetta, M.; Zaia, L.; Huard, V.; Montfort, O.; Cantoro, R.; Insinga, G.; Venini, F.; Calao, P.; Bernardi, P.
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021 IEEE International Symposium on. :1-6 Oct, 2021
Conference
In: IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC , 2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration, VLSI-SoC 2023. (IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC, 2023)
Conference
In: 2023 IEEE 24th Latin American Test Symposium, LATS 2023 , 2023 IEEE 24th Latin American Test Symposium, LATS 2023. (2023 IEEE 24th Latin American Test Symposium, LATS 2023, 2023)
Conference
Degli Abbati, L.; Ullmann, R.; Coppetta, M.; Paganini, G.; Insinga, G.; Calao, P.; Bernardi, P.; Zaia, L.; Huard, V.; Montfort, O.; Cantoro, R.; Venini, F.
In: Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT , 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021. (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT, 2021, 2021-October)
Academic Journal
Ancilotti, P.; Cavina, R.; Lijtmaer, N.; Eastman, Charles M.; Capocaccia, Fabio; Cagliano, D.; Taddei, R.; Insinga, G.; Forrest, A.R.; Phillips, R.L.; Geister, D.E.; Van Roekel, J.R.; Ljunggren, Stefan; Melhuus, Halfdan
(1972) 634p.
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[AR] Insinga, G.
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