학술논문
'학술논문'
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1~10
Conference
ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005. Semiconductor Manufacturing Semiconductor Manufacturing, 2005. ISSM 2005, IEEE International Symposium on. :394-397 2005
Academic Journal
Dobrzhinetskaya, L.F.; Green, H.W.; Weschler, M.; Darus, M.; Wang, Y.-C.; Massonne, H.-J.; Stöckhert, B.
In: Earth and Planetary Science Letters . (Earth and Planetary Science Letters, 30 May 2003, 210(3-4):399-410)
An infrared microscope for use on a focused ion beam for circuit edit and backside edit applications
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis , ISTFA 2015 - Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2015, 2015-January:97-103)
Book
In: Focused Ion Beam Systems: Basics and Applications . (Focused Ion Beam Systems: Basics and Applications, 1 January 2007, 9780521831994:67-86)
Conference
Blanc-Coquand, S.; Hinschberger, B.; Rouchouze, E.; Sicurani, E.; Castagna, M.; Weschler, M.; Dworkin, L.; Renard, D.; Panyasak, A.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XVIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2004, 5375(PART 2):819-826)
Academic Journal
Blanc-Coquand, S.; Hinschberger, B.; Rouchouze, E.; Sicurani, E.; Teshima, J.; Castagna, M.; Weschler, M.; Dworkin, L.; Renard, D.
In: MICRO . (MICRO, June 2004, 22(5):77-86)
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[AR] Weschler, M.
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