학술논문
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1~10
Conference
El-Kareh, B.; Balster, S.; Leitz, W.; Steinmann, P.; Yasuda, H.; Corsi, M.; Dawoodi, K.; Dirnecker, C.; Foglietti, P.; Haeusler, A.; Menz, P.; Ramin, M.; Scharnagl, T.; Schiekofer, M.; Schober, M.; Schulz, U.; Swanson, L.; Tatman, D.; Waitschull, M.; Weijtmans, J.W.; Willis, C.
2003 Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology Meeting, 2003. Proceedings of the. :211-214 2003
Conference
Proceedings IEEE The Tenth Annual International Workshop on Micro Electro Mechanical Systems. An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots Micro electro mechanical systems Micro Electro Mechanical Systems, 1997. MEMS '97, Proceedings, IEEE., Tenth Annual International Workshop on. :436-441 1997
Conference
Yang, B.; Takalkar, R.; Ren, Z.; Black, L.; Dube, A.; Weijtmans, J.W.; Li, J.; Johnson, J.B.; Faltermeier, J.; Madan, A.; Zhu, Z.; Turansky, A.; Xia, G.; Chakravarti, A.; Pal, R.; Chan, K.; Reznicek, A.; Adam, T.N.; de Souza, J.P.; Harley, E.C.T.; Greene, B.; Gehring, A.; Cai, M.; Aime, D.; Sun, S.; Meer, H.; Holt, J.; Theodore, D.; Zollner, S.; Grudowski, P.; Sadana, D.; Park, D.-G.; Mocuta, D.; Schepis, D.; Maciejewski, E.; Luning, S.; Pellerin, J.; Leobandung, E.
2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008
Conference
Song, L.; Liang, Y.; Onoda, H.; Lai, C. W.; Wallner, T. A.; Pofelski, A.; Gruensfelder, C.; Josse, E.; Okawa, T.; Brown, J.; Williams, R.Q.; Holt, J.; Weijtmans, J.W.; Greene, B.; Utomo, H. K.; Lee, S. C.; Nair, D.; Zhang, Q.; Zhu, C.; Wu, X.; Sherony, M.; Lee, Y. M.; Henson, W. K.; Divakaruni, R.; Kaste, E.
Proceedings of Technical Program of 2012 VLSI Technology, System and Application VLSI Technology, Systems, and Applications (VLSI-TSA), 2012 International Symposium on. :1-2 Apr, 2012
Academic Journal
In: Journal of Microscopy . (Journal of Microscopy, August 2010, 239(2):154-158)
Academic Journal
Simoen, E.; Gonzalez, M.B.; Vissouvanadin, B.; Chowdhury, M.K.; Verheyen, P.; Hikavyy, A.; Bender, H.; Loo, R.; Claeys, C.; Machkaoutsan, V.; Tomasini, P.; Thomas, S.; Lu, J.P.; Weijtmans, J.W.; Wise, R.
In: IEEE Transactions on Electron Devices . (IEEE Transactions on Electron Devices, March 2008, 55(3):925-930)
Academic Journal
Huang, J.; Kim, M.J.; Chidambaram, P.R.; Irwin, R.B.; Jones, P.J.; Weijtmans, J.W.; Koontz, E.M.; Wang, Y.G.; Tang, S.; Wise, R.
In: Applied Physics Letters . (Applied Physics Letters, 2006, 89(6))
Academic Journal
In: Synthetic Metals . (Synthetic Metals, January 1997, 84(1-3):583-584)
Periodical
Kamruzzaman Chowdhury, M.; Vissouvanadin, B.; Bargallo Gonzalez, Mireia; Bhouri, N.; Verheyen, Peter; Hikavyy, H.; Richard, O.; Geypen, J.; Bender, H.; Loo, Roger; Claeys, C.; Simoen, Eddy; Machkaoutsan, V.; Tomasini, P.; Thomas, S.G; Lu, J.P.; Weijtmans, J.W.; Wise, R.
Diffusion and Defect Data Part B: Solid State Phenomena; October 2007, Vol. 131 Issue: 1 p95-100, 6p
Conference
Zhibin Ren; Pei, G.; Li, J.; Yang, B.F.; Takalkar, R.; Chan, K.; Xia, G.; Zhu, Z.; Madan, A.; Pinto, T.; Adam, T.; Miller, J.; Dube, A.; Black, L.; Weijtmans, J.W.; Yang, B.; Harley, E.; Chakravarti, A.; Kanarsky, T.; Pal, R.
2008 Symposium on VLSI Technology; 2008, p172-173, 2p
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제한된 항목
[AR] Weijtmans, J.W.
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