학술논문
'학술논문'
에서 검색결과 8건 | 목록
1~10
Academic Journal
In: Ecology and Evolution . (Ecology and Evolution, March 2022, 12(3))
Academic Journal
Snaidero, N.; Simons, M.; Möbius, W.; Goebbels, S.; Edgar, J.; Nave, K.-A.; Czopka, T.; Lyons, D.A.; Hekking, L.H.P.; Mathisen, C.; Verkleij, D.; Merkler, D.
In: Cell . (Cell, 2014, 156(1-2):277-290)
Conference
Bicaïs-Lépinay, N.; André, F.; Brevers, S.; Guyader, P.; Trouiller, C.; Kwakman, L.F.Tz.; Pokrant, S.; Verkleij, D.; Schampers, R.; Ithier, L.; Sicurani, E.; Wyon, C.
Proceedings of SPIE; Nov2006, Issue 1, p615217-615217-10, 10p
Academic Journal
In: Microelectronics Reliability . (Microelectronics Reliability, 1998, 38(6-8):869-876)
Conference
Schmitt-Weaver, E.; Kubis, M.; Henke, W.; Slotboom, D.; Hoogenboom, T.; Mulkens, J.; Coogans, M.; Ten Berge, P.; Verkleij, D.; Van De Mast, F.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXVIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2014, 9050)
Conference
Cantu, P.; Baldi, L.; Piacentini, P.; Sytsma, J.; Le Gratiet, B.; Gaugiran, S.; Wong, P.; Miyashita, H.; Atzei, L.R.; Buch, X.; Verkleij, D.; Toublan, O.; Perez-Murano, F.; Mecerreyes, D.
In: Proceedings of SPIE - The International Society for Optical Engineering , Optical Microlithography XXIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2010, 7640)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis , ISTFA 2007 - Proceedings of the 33rd International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2007, :107-114)
검색 결과 제한하기
제한된 항목
[AR] Verkleij, D.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어