학술논문
'학술논문'
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1~10
Academic Journal
In: Journal of Materials Research . (Journal of Materials Research, 2024)
Academic Journal
In: Scientific Reports . (Scientific Reports, December 2023, 13(1))
Academic Journal
Kim, Y.; Seo, S.; Consiglio, S.; Jamison, P.; Higuchi, H.; Rasch, M.; Wu, E.Y.; Kong, D.; Saraf, I.; Catano, C.; Muralidhar, R.; Nguyen, S.; DeVries, S.; Van der Straten, O.; Sankarapandian, M.; Pujari, R.N.; Gasasira, A.; Mcdermott, S.M.; Miyazoe, H.; Koty, D.; Yang, Q.; Yan, H.; Clark, R.; Tapily, K.; Engelmann, S.; Robison, R.R.; Wajda, C.; Mosden, A.; Tsunomura, T.; Soave, R.; Saulnier, N.; Haensch, W.; Leusink, G.; Biolsi, P.; Narayanan, V.; Ando, T.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 42(5):759-762 May, 2021
Academic Journal
Lanzillo, N.A.; Yang, C.; Motoyama, K.; Huang, H.; Cheng, K.; Maniscalco, J.; Van Der Straten, O.; Penny, C.; Standaert, T.; Choi, K.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 40(11):1804-1807 Nov, 2019
Conference
Wu, H.; Katragadda, V.; Evarts, E.; Edwards, E.; Southwick, R.; Dutta, A.; Lauer, G.; Mehta, V.; Johnson, R.; van der Straten, O.; Reznicek, A.; Wordeman, M.; Rizzolo, M.; Patlolla, R.; Metzler, D.; Yang, C.; Edelstein, D.; Canaperi, D.; Teehan, S.; Slaughter, J.M.; Worledge, D.C.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :2.3.1-2.3.4 Dec, 2021
Conference
Motoyama, K.; van der Straten, O.; Maniscalco, J.; Huang, H.; Kim, YB.; Choi, JK.; Lee, JH.; Hu, C.-K.; McLaughlin, P.; Standaert, T.; Quon, R.; Bonilla, G.
2018 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2018 IEEE International. :40-42 Jun, 2018
Conference
Edelstein, D.; Rizzolo, M.; Sil, D.; Dutta, A.; DeBrosse, J.; Wordeman, M.; Arceo, A.; Chu, I. C.; Demarest, J.; Edwards, E. R. J.; Evarts, E. R.; Fullam, J.; Gasasira, A.; Hu, G.; Iwatake, M.; Johnson, R.; Katragadda, V.; Levin, T.; Li, J.; Liu, Y.; Long, C.; Maffitt, T.; McDermott, S.; Mehta, S.; Mehta, V.; Metzler, D.; Morillo, J.; Nakamura, Y.; Nguyen, S.; Nieves, P.; Pai, V.; Patlolla, R.; Pujari, R.; Southwick, R.; Standaert, T.; van der Straten, O.; Wu, H.; Yang, C.-C.; Houssameddine, D.; Slaughter, J. M.; Worledge, D. C.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :11.5.1-11.5.4 Dec, 2020
Conference
In: ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings , 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2024. (ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings, 2024)
Conference
Rodriguez, G.; Van Der Straten, O.; Mehta, V.; Slaughter, J.M.; Kaiser, C.; Huang, C.-F.; Frye, D.; Carr, R.
In: ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings , 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2024. (ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings, 2024)
Conference
Standaert, T.; Beique, G.; Chen, H.-C.; Chen, S.-T.; Hamieh, B.; Lee, J.; McLaughlin, P.; McMahon, J.; Mignot, Y.; Mont, F.; Motoyama, K.; Nguyen, S.; Patlolla, R.; Peethala, B.; Priyadarshini, D.; Rizzolo, M.; Saulnier, N.; Shobha, H.; Siddiqui, S.; Spooner, T.; Tang, H.; van der Straten, O.; Verduijn, E.; Xu, Y.; Zhang, X.; Arnold, J.; Canaperi, D.; Colburn, M.; Edelstein, D.; Paruchuri, V.; Bonilla, G.
2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC) Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2016 IEEE International. :2-4 May, 2016
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제한된 항목
[AR] Van der Straten, O.
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