학술논문
'학술논문'
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1~10
Academic Journal
Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M.S.; Tancorre, V.; Ugioli, R.
IEEE Transactions on Computers IEEE Trans. Comput. Computers, IEEE Transactions on. 72(5):1447-1459 May, 2023
Academic Journal
Angione, F.; Appello, D.; Bernardi, P.; Calabrese, A.; Quer, S.; Reorda, M.S.; Tancorre, V.; Ugioli, R.
IEEE Access Access, IEEE. 11:105655-105676 2023
Conference
Angione, F.; Bernardi, P.; Calabrese, A.; Cardone, L.; Niccoletti, A.; Piumatti, D.; Quer, S.; Appello, D.; Tancorre, V.; Ugioli, R.
2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :355-364 Sep, 2022
Conference
Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Reorda, M. Sonza; Appello, D.; Tancorre, V.; Ugioli, R.
2022 IEEE 31st International Symposium on Industrial Electronics (ISIE) Industrial Electronics (ISIE), 2022 IEEE 31st International Symposium on. :623-626 Jun, 2022
Conference
Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Guerrero, J.; Huch, M.; Iaria, G.; Kilian, T.; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Reorda, M. Sonza; Sterpone, L.; Tancorre, V.; Ugioli, R.
2022 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2022 IEEE European. :1-10 May, 2022
Conference
2022 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2022 IEEE European. :1-6 May, 2022
Academic Journal
IEEE Access Access, IEEE. 10:56440-56457 2022
Conference
Appello, D.; Bernardi, P.; Calabrese, A.; Littardi, S.; Pollaccia, G.; Quer, S.; Tancorre, V.; Ugioli, R.
2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2021 24th International Symposium on. :69-74 Apr, 2021
Conference
Almeida, F.; Bernardi, P.; Calabrese, D.; Restifo, M.; Reorda, M. Sonza; Appello, D.; Pollaccia, G.; Tancorre, V.; Ugioli, R.; Zoppi, G.
2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2019 IEEE 22nd International Symposium on. :1-6 Apr, 2019
Conference
Angione, F.; Bernardi, P.; Filipponi, G.; Tempesta, C.; Reorda, M.S.; Appello, D.; Tancorre, V.; Ugioli, R.
In: Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT , Proceedings - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022. (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT, 2022, 2022-October)
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[AR] Ugioli, R.
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