학술논문
'학술논문'
에서 검색결과 22건 | 목록
1~10
Academic Journal
Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M.S.; Tancorre, V.; Ugioli, R.
IEEE Transactions on Computers IEEE Trans. Comput. Computers, IEEE Transactions on. 72(5):1447-1459 May, 2023
Academic Journal
IEEE Access Access, IEEE. 10:56440-56457 2022
Conference
Appello, D.; Bernardi, P.; Calabrese, A.; Littardi, S.; Pollaccia, G.; Quer, S.; Tancorre, V.; Ugioli, R.
2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2021 24th International Symposium on. :69-74 Apr, 2021
Conference
Almeida, F.; Bernardi, P.; Calabrese, D.; Restifo, M.; Reorda, M. Sonza; Appello, D.; Pollaccia, G.; Tancorre, V.; Ugioli, R.; Zoppi, G.
2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2019 IEEE 22nd International Symposium on. :1-6 Apr, 2019
Conference
Appello, D.; Bernardi, P.; Giacopelli, G.; Motta, A.; Pagani, A.; Pollaccia, G.; Rabbi, C.; Restifo, M.; Ruberg, P.; Sanchez, E.; Villa, C.M.; Venini, F.
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017. :646-649 Mar, 2017
Academic Journal
Appello, D.; Bugeja, C.; Pollaccia, G.; Bernardi, P.; Cantoro, R.; Restifo, M.; Sanchez, E.; Venini, F.
IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 35(3):46-53 Jun, 2018
Conference
Proceedings 11th International Conference on Image Analysis and Processing Image analysis and processing Image Analysis and Processing, 2001. Proceedings. 11th International Conference on. :572-577 2001
Academic Journal
Bernardi, P.; Cantoro, R.; Colazzo, A.; Restifo, M.; Sanchez, E.; Venini, F.; Appello, D.; Bugeja, C.; Motta, A.; Pagani, A.; Pollaccia, G.
In: Journal of Low Power Electronics . (Journal of Low Power Electronics, March 2018, 14(1):86-98)
Academic Journal
In: Journal of Electronic Testing: Theory and Applications (JETTA) . (Journal of Electronic Testing: Theory and Applications (JETTA), 1 February 2018, 34(1):43-52)
Conference
2006 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems Circuits and Systems (ISCAS), 2006 IEEE International Symposium on. :4 pp.-2756 2006
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제한된 항목
[AR] Pollaccia, G.
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