학술논문
'학술논문'
에서 검색결과 56건 | 목록
1~10
Conference
Fan, S.-C.; Jamison, P.; Pancharatnam, S.; Sankarapandian, M.; Xie, R.; Waskiewicz, C.; Strane, J.; Lee, J.; Shobha, H.; Demarest, J.; Peethala, C.; Jagannathan, H.; Wynne, J.
2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2023 34th Annual. :1-3 May, 2023
Conference
Chan, Victor; Bergendahl, M.; Choi, S.; Gaul, A.; Strane, J.; Greene, A.; Demarest, J.; Li, J.; Le, C.; Teehan, S.; Guo, D
2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2020 31st Annual. :1-4 Aug, 2020
Conference
Tsutsui, G.; Song, S.; Strane, J.; Xie, R.; Qin, L.; Zhang, C.; Schmidt, D.; Fan, S.; Hong, B.; Jung, Y.; Sohn, C-W.; Hwang, I.; Yim, J.; Son, G. H.; Jo, G.; Kim, K-I.; Sankarapandian, M.; Mochizuki, S.; Seshadri, I.; Miller, E.; Li, J.; Demarest, J.; Waskiewicz, C.; Southwick, R. G.; Zhou, H.; Pujari, R. N.; Nieves, P.; Wang, M.; Jagannathan, H.; Anderson, B.; Guo, D.; Divakaruni, R.; Wu, T.; Seo, K-I.; Bu, H.
2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :34.4.1-34.4.4 Dec, 2022
Conference
Chan, Victor; Bergendahl, M.; Strane, J.; Austin, B.; Boye, C.; Mattam, S.; Choi, S.; Gaul, A.; Cheng, K.; Greene, A.; Lea, D.; Levin, T.; Karve, G.; Teehan, S.; Guo, D.
2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) Advanced Semiconductor Manufacturing Conference (ASMC), 2019 30th Annual SEMI. :1-4 May, 2019
Conference
Jagannathan, H.; Anderson, B.; Sohn, C-W.; Tsutsui, G.; Strane, J.; Xie, R.; Fan, S.; Kim, K-I.; Song, S.; Sieg, S.; Seshadri, I.; Mochizuki, S.; Wang, J.; Rahman, A.; Cheon, K-Y.; Hwang, I.; Demarest, J.; Do, J.; Fullam, J.; Jo, G.; Hong, B.; Jung, Y.; Kim, M.; Kim, S.; Lallement, R.; Levin, T.; Li, J.; Miller, E.; Montanini, P.; Pujari, R.; Osborn, C.; Sankarapandian, M.; Son, G-H.; Waskiewicz, C.; Wu, H.; Yim, J.; Young, A.; Zhang, C.; Varghese, A.; Robison, R.; Burns, S.; Zhao, K.; Yamashita, T.; Dechene, D.; Guo, D.; Divakaruni, R.; Wu, T.; Seo, K-I.; Bu, H.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :26.1.1-26.1.4 Dec, 2021
Conference
Guo, D.; Shang, H.; Seo, K.; Haran, B.; Standaert, T.; Gupta, D.; Alptekin, E.; Bae, D.; Bae, G.; Chanemougame, D.; Cheng, K.; Cho, J.; Hamieh, B.; Hong, J.; Hook, T.; Jung, J.; Kambhampati, R.; Kim, B.; Kim, H.; Kim, K.; Kim, T.; Liu, D.; Mallela, H.; Montanini, P.; Mottura, M.; Nam, S.; Ok, I.; Park, Y.; Paul, A.; Prindle, C.; Ramachandran, R.; Sardesai, V.; Scholze, A.; Seo, S.; Southwick, R.; Strane, J.; Sun, X.; Tsutsui, G.; Tripathi, N.; Vega, R.; Weybright, M.; Xie, R.; Yeh, C.; Bu, H.; Burns, S.; Canaperi, D.; Celik, M.; Colburn, M.; Jagannathan, H.; Kanakasabaphthy, S.; Kleemeier, W.; Liebmann, L.; Mcherron, D.; Oldiges, P.; Paruchuri, V.; Spooner, T.; Stathis, J.; Divakaruni, R.; Gow, T.; Iacoponi, J.; Jenq, J.; Sampson, R; Yang, W.; Khare, M.
2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on. :1-4 Oct, 2014
Conference
Wu, H.; Gluschenkov, O.; Tsutsui, G.; Niu, C.; Brew, K.; Durfee, C.; Prindle, C.; Kamineni, V.; Mochizuki, S.; Lavoie, C.; Nowak, E.; Liu, Z.; Yang, J.; Choi, S.; Demarest, J.; Yu, L.; Carr, A.; Wang, W.; Strane, J.; Tsai, S.; Liang, Y.; Amanapu, H.; Saraf, I.; Ryan, K.; Lie, F.; Kleemeier, W.; Choi, K.; Cave, N.; Yamashita, T.; Knorr, A.; Gupta, D.; Haran, B.; Guo, D.; Bu, H.; Khare, M.
2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :35.4.1-35.4.4 Dec, 2018
Conference
Hook, Terence B.; Allibert, F.; Balakrishnan, K.; Doris, Bruce; Guo, Dechao; Mavilla, Narasimha; Nowak, E.; Tsutsui, G.; Southwick, R.; Strane, J.; Sun, Xin
2014 SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2014 IEEE. :1-3 Oct, 2014
Conference
Guo, D.; Karve, G.; Tsutsui, G.; Lim, K-Y; Robison, R.; Hook, T.; Vega, R.; Liu, D.; Bedell, S.; Mochizuki, S.; Lie, F.; Akarvardar, K.; Wang, M.; Bao, R.; Burns, S.; Chan, V.; Cheng, K.; Demarest, J.; Fronheiser, J.; Hashemi, P.; Kelly, J.; Li, J.; Loubet, N.; Montanini, P.; Sahu, B.; Sankarapandian, M.; Sieg, S.; Sporre, J.; Strane, J.; Southwick, R.; Tripathi, N.; Venigalla, R.; Wang, J.; Watanabe, K.; Yeung, C. W.; Gupta, D.; Doris, B.; Felix, N.; Jacob, A.; Jagannathan, H.; Kanakasabapathy, S.; Mo, R.; Narayanan, V.; Sadana, D.; Oldiges, P.; Stathis, J.; Yamashita, T.; Paruchuri, V.; Colburn, M.; Knorr, A.; Divakaruni, R.; Bu, H.; Khare, M.
2016 IEEE Symposium on VLSI Technology VLSI Technology, 2016 IEEE Symposium on. :1-2 Jun, 2016
Conference
Radens, C.J.; Kudelka, S.; Nesbit, L.; Malik, R.; Dyer, T.; Dubuc, C.; Joseph, T.; Seitz, M.; Clevenger, L.; Arnold, N.; Mandelman, J.; Divakaruni, R.; Casarotto, D.; Lea, D.; Jaiprakash, V.C.; Sim, J.; Faltermeier, J.; Low, K.; Strane, J.; Halle, S.; Ye, Q.; Bukofsky, S.; Gruening, U.; Schloesser, T.; Bronner, G.
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :349-352 2000
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[AR] Strane, J.
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