학술논문
'학술논문'
에서 검색결과 49건 | 목록
1~10
Conference
Bhuiyan, M.; Kim, M.; Zhou, H.; Lo, H.; Siddiqui, S.; Stolfi, M.; Guarini, T.; Pujari, R.; Davey, E.; Stuckert, E.; Li, J.; Chou, A.; Zhao, K.; Wang, M.; Guo, D.; Colombeau, B.; Loubet, N.; Haran, B.; Bu, H.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :1-4 Dec, 2021
Conference
Bhosale, P.; Lanzillo, N.; Motoyama, K.; Nogami, T.; Simon, A.; Huang, H.; Chen, K.; Mignot, Y.; Edelstein, D.; Loubet, N.; Haran, B.; Parikh, S.; Tao, R.; Gage, M.; Reidy, S.; Chen, L.; Stolfi, M.; Lee, J.; Chen, F.; Ha, T.; Yeoh, A.; Natarajan, S.
2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021
Conference
Dong, L.; Hung, S.; Bevan, M.; Jamison, P.; Zhang, J.; Zhou, H.; Colombeau, B.; Curtis, R.; Devrajan, J.; Bao, R.; George, R.; Kim, M.; Karandikar, K.; Stolfi, M.; Loubet, N.; Swenberg, J.; Guarini, T.; Wang, L.; Yan, Y.; Banthia, V.; Kuppurao, S.; Haran, B.; Natarajan, S.
2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021
Conference
Bhosale, P.; Parikh, S.; Lanzillo, N.; Tao, R.; Nogami, T.; Gage, M.; Shaviv, R.; Huang, H.; Simon, A.; Stolfi, M.; Reidy, S.; Lee, J.; Loubet, N.; Haran, B.
2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
Conference
Mochizuki, S.; Colombeau, B.; Zhang, J.; Kung, S. C.; Stolfi, M.; Zhou, H.; Breton, M.; Watanabe, K.; Li, J.; Jagannathan, H.; Cogorno, M.; Mandrekar, T.; Chen, P.; Loubet, N.; Natarajan, S.; Haran, B.
2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
Modified ALD TaN Barrier with Ru Liner and Dynamic Cu Reflow for 36nm Pitch Interconnect Integration
Conference
Bhosale, P. S.; Maniscalco, J.; Lanzillo, N.; Nogami, T.; Canaperi, D.; Motoyama, K.; Huang, H.; McLaughlin, P.; Shaviv, R.; Stolfi, M.; Vinnakota, R.; How, G.; Pethe, S.; Sheu, B.; Xie, X.; Chen, L.
2018 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2018 IEEE International. :43-45 Jun, 2018
Conference
Ryan, E. Todd; Priyadarshini, D.; Gates, S. M.; Shobha, H.; Chen, J.; Virwani, K.; Madan, A.; Adams, E.; Huang, E.; Liniger, E.; Collins, D.; Stolfi, M.; Yim, K. S.; Demos, A.; Grill, A.
2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM) Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM), 2015 IEEE International. :349-352 May, 2015
Conference
Priyadarshini, Deepika; Nguyen, S.; Shobha, H.; Cohen, S.; Shaw, T.; Liniger, E.; Hu, C.K.; Parks, C.; Adams, E.; Burnham, J.; Simon, A.H.; Bonilla, G.; Grill, A.; Canaperi, D.; Edelstein, D.; Collins, D.; Balseanu, M.; Stolfi, M.; Ren, J.; Shah, K.
IEEE International Interconnect Technology Conference Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2014 IEEE International. :185-188 May, 2014
Conference
Mochizuki, S.; Colombeau, B.; Yu, L.; Dube, A.; Choi, S.; Stolfi, M.; Bi, Z.; Chang, F.; Conti, R. A.; Liu, P.; Winstel, K. R.; Jagannathan, H.; Gossmann, H.-J.; Loubet, N.; Canaperi, D. F.; Guo, D.; Sharma, S.; Chu, S.; Boland, J.; Jin, Q.; Li, Z.; Lin, S.; Cogorno, M.; Chudzik, M.; Natarajan, S.; McHerron, D. C.; Haran, B.
2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :35.2.1-35.2.4 Dec, 2018
Conference
Breil, N.; Carr, A.; Kuratomi, T.; Lavoie, C.; Chen, I.-C.; Stolfi, M.; Chiu, K. D.; Wang, W.; Van Meer, H.; Sharma, S.; Hung, R.; Gelatos, A.; Jordan-Sweet, J.; Levrau, E.; Loubet, N.; Chao, R.; Ye, J.; Ozcan, A.; Surisetty, C.; Chudzik, M.
2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T216-T217 Jun, 2017
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제한된 항목
[AR] Stolfi, M.
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