학술논문
'학술논문'
에서 검색결과 13건 | 목록
1~10
Conference
In: Proceedings of the Annual Conference of the International Speech Communication Association, INTERSPEECH , Interspeech 2023. (Proceedings of the Annual Conference of the International Speech Communication Association, INTERSPEECH, 2023, 2023-August:5566-5570)
Academic Journal
In: PLoS Computational Biology . (PLoS Computational Biology, 2019, 15(8))
Academic Journal
In: Journal of Micro/ Nanolithography, MEMS, and MOEMS . (Journal of Micro/ Nanolithography, MEMS, and MOEMS, 1 July 2015, 14(3))
Conference
In: ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings , 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2020. (ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings, August 2020, 2020-August)
Conference
In: 2020 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA 2020 , 2020 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA 2020. (2020 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA 2020, August 2020, :12)
Conference
In: 2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020 , 2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020. (2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020, August 2020)
Conference
In: European Solid-State Device Research Conference , 49th European Solid-State Device Research Conference, ESSDERC 2019. (European Solid-State Device Research Conference, September 2019, 2019-September:57-60)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Photomask Technology 2019. (Proceedings of SPIE - The International Society for Optical Engineering, 2019, 11148)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , 35th European Mask and Lithography Conference, EMLC 2019. (Proceedings of SPIE - The International Society for Optical Engineering, 2019, 11177)
Conference
Gorhad, K.; Sharoni, O.; Dmitriev, V.; Cohen, A.; Van Haren, R.; Roelofs, C.; Cekli, H.E.; Gallagher, E.; Leray, P.; Beyer, D.; Trautzsch, T.; Steinert, S.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXX. (Proceedings of SPIE - The International Society for Optical Engineering, 2016, 9778)
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제한된 항목
[AR] Sharoni, O.
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