학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 13건 | 목록 1~10
Conference
In: Proceedings of the Annual Conference of the International Speech Communication Association, INTERSPEECH, Interspeech 2023. (Proceedings of the Annual Conference of the International Speech Communication Association, INTERSPEECH, 2023, 2023-August:5566-5570)
Academic Journal
In: Journal of Micro/ Nanolithography, MEMS, and MOEMS. (Journal of Micro/ Nanolithography, MEMS, and MOEMS, 1 July 2015, 14(3))
Conference
In: ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings, 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2020. (ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings, August 2020, 2020-August)
Conference
In: 2020 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA 2020, 2020 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA 2020. (2020 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA 2020, August 2020, :12)
Conference
In: 2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020, 2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020. (2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020, August 2020)
Conference
In: European Solid-State Device Research Conference, 49th European Solid-State Device Research Conference, ESSDERC 2019. (European Solid-State Device Research Conference, September 2019, 2019-September:57-60)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Photomask Technology 2019. (Proceedings of SPIE - The International Society for Optical Engineering, 2019, 11148)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, 35th European Mask and Lithography Conference, EMLC 2019. (Proceedings of SPIE - The International Society for Optical Engineering, 2019, 11177)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Metrology, Inspection, and Process Control for Microlithography XXX. (Proceedings of SPIE - The International Society for Optical Engineering, 2016, 9778)
검색 결과 제한하기
제한된 항목
[AR] Sharoni, O.
발행연도 제한
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학술DB(Database Provider)
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