학술논문
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1~10
Conference
Hergenrother, J.M.; Wilk, G.D.; Nigam, T.; Klemens, F.P.; Monroe, D.; Silverman, P.J.; Sorsch, T.W.; Busch, B.; Green, M.L.; Baker, M.R.; Boone, T.; Bude, M.K.; Ciampa, N.A.; Ferry, E.J.; Fiory, A.T.; Hillenius, S.J.; Jacobson, D.C.; Johnson, R.W.; Kalavade, P.; Keller, R.; King, C.A.; Kornblit, A.; Krautter, H.W.; Lee, J.T.-C.; Mansfield, W.M.; Miner, J.F.; Morris, M.D.; Oh, S.-H.; Rosamilia, J.M.; Sapjeta, B.J.; Short, K.; Steiner, K.; Muller, D.A.; Voyles, P.M.; Grazul, J.L.; Shero, E.; Givens, M.E.; Pomarede, C.; Mazanec, M.; Werkhoven, C.
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) Electron devices meeting 2001 Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International. :3.1.1-3.1.4 2001
Conference
Yudong Kim; Gebara, G.; Freiler, M.; Barnett, J.; Riley, D.; Chen, J.; Torres, K.; JaeEun Lim; Foran, B.; Shaapur, F.; Agarwal, A.; Lysaght, P.; Brown, G.A.; Young, C.; Borthakur, S.; Hong-Jyh Li; Nguyen, B.; Zeitzoff, P.; Bersuker, G.; Derro, D.; Bergmann, R.; Murto, R.W.; Hou, A.; Huff, H.R.; Shero, E.; Pomarede, C.; Givens, M.; Mazanez, M.; Werkhoven, C.
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) Electron devices meeting 2001 Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International. :20.2.1-20.2.4 2001
Conference
In: Materials Research Society Symposium - Proceedings . (Materials Research Society Symposium - Proceedings, 2000, 592:69-74)
Conference
MRS Online Proceedings Library; Dec1999, Vol. 561 Issue 1, p147-154, 8p
Conference
MRS Online Proceedings Library; 1999, Vol. 592 Issue 1, p89-94, 6p
Academic Journal
MRS Online Proceedings Library. 592(1):89-94
Conference
Del Vitto, A.; Piagge, R.; Caniatti, M.; Pavia, G.; Sammiceli, F.; Ravizza, E.; Grasso, S.; Spadoni, S.; Sebastiani, A.; Scozzari, C.; Ghidini, G.; Alessandri, M.; Wiemer, C.; Pomarède, C.; Maes, J.W.
In: ECS Transactions , ECS Transactions - 5th International Symposium on High Dielectric Constant Materials and Gate Stacks. (ECS Transactions, 2007, 11(4):497-508)
Conference
Hou, T.H.; Gutt, J.; Lim, C.; Gardner, M.; Murto, R.W.; Huff, H.R.; Marcus, S.; Pomarede, C.; Shero, E.; De Warrd, H.; Werkhoven, C.
In: Proceedings - Electrochemical Society , Physics and Technology of High-k Gate Dielectric I - Proceedings of the International Symposium on High Dielectric Constant Materials: Materials Science, Processing Reliability, and Manufacturing Iss. (Proceedings - Electrochemical Society, 2003, 28:141-148)
Conference
Lim, C.; Kim, Y.; Hou, A.; Gutt, J.; Tamim, J.; Chaudhary, N.; Bersuker, G.; Barnett, J.; Young, C.; Zeitzoff, P.; Brown, G.A.; Gardner, M.; Murto, R.W.; Huff, H.R.; Marcus, S.; Pomarede, C.; Shero, E.; De Waard, H.; Werkhoven, C.; Lee, C.
In: Proceedings - Electrochemical Society , Physics and Technology of High-k Gate Dielectric I - Proceedings of the International Symposium on High Dielectric Constant Materials: Materials Science, Processing Reliability, and Manufacturing Iss. (Proceedings - Electrochemical Society, 2003, 28:83-91)
Conference
Hergenrother, J.M.; Wilk, G.D.; Nigam, T.; Klemens, F.P.; Monroe, D.; Silverman, P.J.; Sorsch, T.W.; Busch, B.; Green, M.L.; Baker, M.R.; Boone, T.; Bude, M.K.; Ciampa, N.A.; Ferry, E.J.; Fiory, A.T.; Hillenius, S.J.; Jacobson, D.C.; Johnson, R.W.; Kalavade, P.; Keller, R.C.; King, C.A.; Kornblit, A.; Krautter, H.W.; Lee, J.T.-C.; Mansfield, W.M.; Miner, J.F.; Morris, M.D.; Oh, S.-H.; Rosamilia, J.M.; Sapjeta, B.J.; Short, K.; Steiner, K.; Muller, D.A.; Voyles, P.M.; Grazul, J.L.; Shero, E.J.; Givens, M.E.; Pomarede, C.; Mazanec, M.; Werkhoven, C.
In: Technical Digest - International Electron Devices Meeting . (Technical Digest - International Electron Devices Meeting, 2001, :51-54)
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제한된 항목
[AR] Pomarede, C.
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