학술논문
'학술논문'
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Academic Journal
Huff, H.R. ; Hou, A.; Lim, C.; Kim, Y.; Barnett, J.; Bersuker, G.; Brown, G.A.; Young, C.D.; Zeitzoff, P.M.; Gutt, J.; Lysaght, P.; Gardner, M.I.; Murto, R.W.
In Microelectronic Engineering 2003 69(2):152-167
Academic Journal
In Journal of Non-Crystalline Solids May 2002 303(1):54-63
Conference
Bersuker, G.; Gutt, J.; Chaudhary, N.; Moumen, N.; Lee, B.H.; Barnett, J.; Gopalan, S.; Brown, G.; Kim, Y.; Young, C.D.; Peterson, J.; Li, H.-J.; Zeitzoff, P.M.; Sim, G.A.J.H.; Lysaght, P.; Gardner, M.; Murto, R.W.; Huff, H.R.
2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :479-484 2004
Conference
Lee, B.H.; Young, C.D.; Choi, R.; Sim, J.H.; Bersuker, G.; Kang, C.Y.; Harris, R.; Brown, G.A.; Matthews, K.; Song, S.C.; Moumen, N.; Barnett, J.; Lysaght, P.; Choi, K.S.; Wen, H.C.; Huffman, C.; Alshareef, H.; Majhi, P.; Gopalan, S.; Peterson, J.; Kirsh, P.; Li, H.-J.; Gutt, J.; Gardner, M.; Huff, H.R.; Zeitzoff, P.; Murto, R.W.; Larson, L.; Ramiller, C.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :859-862 2004
Conference
IEEE International Integrated Reliability Workshop Final Report, 2003 Integrated reliability workshop Integrated Reliability Workshop Final Report, 2003 IEEE International. :28-35 2003
Conference
10th IEEE International Conference of Advanced Thermal Processing of Semiconductors Advanced thermal processing of semiconductors Advanced Thermal Processing of Semiconductors, 2002. RTP 2002. 10th IEEE International Conference of. :93-98 2002
Conference
Huff, H.R.; Agarwal, A.; Kim, Y.; Perrymore, L.; Riley, D.; Barnett, J.; Sparks, C.; Freiler, M.; Gebara, G.; Bowers, B.; Chen, P.J.; Lysaght, P.; Nguyen, B.; Lim, J.E.; Lim, S.; Bersuker, G.; Zeitzoff, P.; Brown, G.A.; Young, C.; Foran, B.; Shaapur, F.; Hou, A.; Lim, C.; Alshareef, H.; Borthakur, S.; Derro, D.J.; Bergmann, R.; Larson, L.A.; Gardner, M.I.; Gutt, J.; Murto, R.W.; Torres, K.; Jackson, M.D.
Extended Abstracts of International Workshop on Gate Insulator. IWGI 2001 (IEEE Cat. No.01EX537) Gate insulator Gate Insulator, 2001. IWGI 2001. Extended Abstracts of International Workshop on. :2-11 2001
Conference
Proceedings of 11th International Conference on Ion Implantation Technology Ion implantation technology Ion Implantation Technology. Proceedings of the 11th International Conference on. :486-489 1996
Conference
2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :597-598 2004
Conference
Kim, Y.; Lim, C.; Young, C.D.; Matthews, K.; Barnett, J.; Foran, B.; Agarwal, A.; Brown, G.A.; Bersuker, G.; Zeitzoff, P.; Gardner, M.; Murto, R.W.; Larson, L.; Metzner, C.; Kher, S.; Huff, H.R.
2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407) VLSI technology VLSI Technology, 2003. Digest of Technical Papers. 2003 Symposium on. :167-168 2003
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제한된 항목
[AR] Murto, R.W.
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