학술논문
'학술논문'
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Academic Journal
Kom Kammeugne, R.; Leroux, C.; Cluzel, J.; Vauche, L.; Le Royer, C.; Krakovinsky, A.; Gwoziecki, R.; Biscarrat, J.; Gaillard, F.; Charles, M.; Bano, E.; Ghibaudo, G.
In Solid State Electronics October 2021 184
Conference
Le Royer, C.; Mohamad, B.; Biscarrat, J.; Vauche, L.; Escoffier, R.; Buckley, J.; Becu, S.; Riat, R.; Gillot, C.; Charles, M.; Ruel, S.; Pimenta-Barros, P.; Posseme, N.; Besson, P.; Boudaa, F.; Vannuffel, C.; Vandendaele, W.; Viey, A.G.; Krakovinsky, A.; Jaud, M.-A.; Modica, R.; Iucolano, F.; Tiec, R. Le; Levi, S.; Orsatelli, M.; Gwoziecki, R.; Sousa, V.
2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2022 IEEE 34th International Symposium on. :49-52 May, 2022
Conference
Viey, A.G.; Vandendaele, W.; Jaud, M.-A.; Coignus, J.; Cluzel, J.; Krakovinsky, A.; Martin, S.; Biscarrat, J.; Gwoziecki, R.; Sousa, V.; Gaillard, F.; Modica, R.; Iucolano, F.; Meneghini, M.; Meneghesso, G.; Ghibaudo, G.
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-8 Mar, 2021
Academic Journal
Viey, A.G.; Vandendaele, W.; Jaud, M.; Gerrer, L.; Garros, X.; Cluzel, J.; Martin, S.; Krakovinsky, A.; Biscarrat, J.; Gwoziecki, R.; Plissonnier, M.; Gaillard, F.; Modica, R.; Iucolano, F.; Meneghini, M.; Meneghesso, G.; Ghibaudo, G.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(4):2017-2024 Apr, 2021
Conference
2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2017 IEEE 23rd International Symposium on. :85-89 Jul, 2017
Conference
Viey, A. G.; Vandendaele, W.; Jaud, M.-A.; Gerrer, L.; Garros, X.; Cluzel, J.; Martin, S.; Krakovinsky, A.; Biscarrat, J.; Gwoziecki, R.; Plissonnier, M.; Gaillard, F.; Modica, R.; Iucolano, F.; Meneghini, M.; Meneghesso, G.; Ghibaudo, G.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :23.6.1-23.6.4 Dec, 2020
Conference
Vandendaele, W.; Martin, S.; Jaud, M.-A; Krakovinsky, A.; Vauche, L.; Le Royer, C.; Biscarrat, J.; Viey, A. G.; Gwoziecki, R.; Modica, R.; Iucolano, F.; Plissonnier, M.; Gaillard, F.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :23.5.1-23.5.4 Dec, 2020
Conference
Krakovinsky, A.; Bocquet, M.; Wacquez, R.; Coignus, J.; Deleruyelle, D.; Djaou, C.; Reimbold, G.; Portal, J-M.
2016 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2016 International Conference on. :152-156 Mar, 2016
Conference
Viey, A.G.; Vandendaele, W.; Jaud, M.-A.; Cluzel, J.; Barnes, J.-P.; Martin, S.; Krakovinsky, A.; Gwoziecki, R.; Plissonnier, M.; Gaillard, F.; Modica, R.; Iucolano, F.; Meneghini, M.; Zanoni, E.; Meneghesso, G.; Ghibaudo, G.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :4.3.1-4.3.4 Dec, 2019
Academic Journal
Kammeugne, R. Kom; Leroux, C.; Cluzel, J.; Vauche, L.; Le Royer, C.; Krakovinsky, A.; Gwoziecki, R.; Biscarrat, J.; Gaillard, F.; Charles, M.; Bano, E.; Ghibaudo, G.
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제한된 항목
[AR] Krakovinsky, A.
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