학술논문
'학술논문'
에서 검색결과 28건 | 목록
1~10
Conference
Parvin, Sajjad; Goli, Mehran; Krachenfels, Thilo; Tajik, Shahin; Seifert, Jean-Pierre; Torres, Frank Sill; Drechsler, Rolf
2023 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) VLSI (ISVLSI), 2023 IEEE Computer Society Annual Symposium on. :1-6 Jun, 2023
Conference
Kuhnapfel, Niclas; Buhren, Robert; Jacob, Hans Niklas; Krachenfels, Thilo; Werling, Christian; Seifert, Jean-Pierre
2022 IEEE Physical Assurance and Inspection of Electronics (PAINE) Physical Assurance and Inspection of Electronics (PAINE), 2022 IEEE. :1-7 Oct, 2022
Conference
Parvin, Sajjad; Krachenfels, Thilo; Tajik, Shahin; Seifert, Jean-Pierre; Torres, Frank Sill; Drechsler, Rolf
2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC) Design Automation Conference (ASP-DAC), 2022 27th Asia and South Pacific. :429-435 Jan, 2022
Conference
Kiyan, Tuba; Krachenfels, Thilo; Amini, Elham; Shakibaei, Zarin; Boit, Christian; Seifert, Jean-Pierre
2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2021 IEEE International Symposium on the. :1-6 Sep, 2021
Conference
2021 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) FDTC Fault Detection and Tolerance in Cryptography (FDTC), 2021 Workshop on. :86-97 Sep, 2021
Conference
2021 IEEE Symposium on Security and Privacy (SP) SP Security and Privacy (SP), 2021 IEEE Symposium on. :1955-1971 May, 2021
Conference
Amini, Elham; Bartels, Kai; Boit, Christian; Eggert, Marius; Herfurth, Norbert; Kiyan, Tuba; Krachenfels, Thilo; Seifert, Jean-Pierre; Tajik, Shahin
2021 IEEE 39th VLSI Test Symposium (VTS) Test Symposium (VTS), 2021 IEEE 39th VLSI. :1-12 Apr, 2021
Academic Journal
Amini, Elham; Jatzkowski, Jörg; Kiyan, Tuba; Renkes, Lars; Krachenfels, Thilo; Tajik, Shahin; Boit, Christian; Altmann, Frank; Brand, Sebastian; Seifert, Jean-Pierre
Journal of Failure Analysis and Prevention. :1-10
Conference
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2020 IEEE International Symposium on the. :1-7 Jul, 2020
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[AR] Krachenfels, Thilo
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