학술논문
'학술논문'
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1~10
Conference
Raghavan, A.; Jalan, U.; Chakraborty, S.; Chang-Ho Le; Laskar, J.; Chen, E.; JongSoo Lee; Cressler, J.D.; Freeman, G.; Joseph, A.
34th European Microwave Conference, 2004. Microwave Conference, 2004. 34th European. 1:21-24 2004
Predictive compact modeling of NQS effects and thermal noise in 90nm mixed-signal/RF CMOS technology
Conference
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :747-750 2004
Conference
33rd European Microwave Conference Proceedings (IEEE Cat. No.03EX723C) European microwave conference Microwave Conference, 2003. 33rd European. 2:579-582 vol.2 2003
Conference
53rd Electronic Components and Technology Conference, 2003. Proceedings. Electronic Components and Technology Conference, 2003. Proceedings. 53rd. :1498-1502 2003
Conference
Jan, C.-H.; Agostinelli, M.; Buehler, M.; Chen, Z.-P.; Choi, S.-J.; Curello, G.; Deshpande, H.; Gannavaram, S.; Hafez, W.; Jalan, U.; Kang, M.; Kolar, P.; Komeyli, K.; Landau, B.; Lake, A.; Lazo, N.; Lee, S.-H.; Leo, T.; Lin, J.; Lindert, N.; Ma, S.; McGill, L.; Meining, C.; Paliwal, A.; Park, J.; Phoa, K.; Post, I.; Pradhan, N.; Prince, M.; Rahman, A.; Rizk, J.; Rockford, L.; Sacks, G.; Schmitz, A.; Tashiro, H.; Tsai, C.; Vandervoorn, P.; Xu, J.; Yang, L.; Yeh, J.-Y.; Yip, J.; Zhang, K.; Zhang, Y.; Bai, P.
2009 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2009 IEEE International. :1-4 Dec, 2009
Conference
Jan, C.-H.; Bai, P.; Biswas, S.; Buehler, M.; Chen, Z.-P.; Curello, G.; Gannavaram, S.; Hafez, W.; He, J.; Hicks, J.; Jalan, U.; Lazo, N.; Lin, J.; Lindert, N.; Litteken, C.; Jones, M.; Kang, M.; Komeyli, K.; Mezhiba, A.; Naskar, S.; Olson, S.; Park, J.; Parker, R.; Pei, L.; Post, I.; Pradhan, N.; Prasad, C.; Prince, M.; Rizk, J.; Sacks, G.; Tashiro, H.; Towner, D.; Tsai, C.; Wang, Y.; Yang, L.; Yeh, J.-Y.; Yip, J.; Mistry, K.
2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008
Conference
Post, I.; Akbar, M.; Curello, G.; Gannavaram, S.; Hafez, W.; Jalan, U.; Komeyli, K.; Lin, J.; Lindert, N.; Park, J.; Rizk, J.; Sacks, G.; Tsai, C.; Yeh, D.; Bai, P.; Jan, C.-H.
2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-3 Dec, 2006
Conference
VanDerVoorn, P.; Agostinelli, M.; Choi, S.-J.; Curello, G.; Deshpande, H.; El-Tanani, M. A.; Hafez, W.; Jalan, U.; Janbay, L.; Kang, M.; Koh, K.-J.; Komeyli, K.; Lakdawala, H.; Lin, J.; Lindert, N.; Mudanai, S.; Park, J.; Phoa, K.; Rahman, A.; Rizk, J.; Rockford, L.; Sacks, G.; Soumyanath, K.; Tashiro, H.; Taylor, S.; Tsai, C.; Xu, H.; Xu, J.; Yang, L.; Young, I.; Yeh, J.-Y.; Yip, J.; Bai, P.; Jan, C.-H.
2010 Symposium on VLSI Technology VLSI Technology (VLSIT), 2010 Symposium on. :137-138 Jun, 2010
Conference
Jan, C.-H.; Agostinelli, M.; Deshpande, H.; El-Tanani, M. A.; Hafez, W.; Jalan, U.; Janbay, L.; Kang, M.; Lakdawala, H.; Lin, J.; Lu, Y-L; Mudanai, S.; Park, J.; Rahman, A.; Rizk, J.; Shin, W.-K.; Soumyanath, K.; Tashiro, H.; Tsai, C.; VanDerVoorn, P.; Yeh, J.-Y.; Bai, P.
2010 International Electron Devices Meeting Electron Devices Meeting (IEDM), 2010 IEEE International. :27.2.1-27.2.4 Dec, 2010
Academic Journal
In: IETE Journal of Research . (IETE Journal of Research, May-August 2002, 48(3-4):303-310)
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제한된 항목
[AR] Jalan, U.
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