학술논문
'학술논문'
에서 검색결과 32건 | 목록
1~10
Conference
Prasad, C.; Bai, P.; Gannavaram, S.; Hafez, W.; Hicks, J.; Jan, C.-H.; Lin, J.; Jones, M.; Komeyli, K.; Kotlyar, R.; Mistry, K.; Post, I.; Tsai, C.
2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :293-298 May, 2010
Conference
Jan, C.-H.; Al-amoody, F.; Chang, H.-Y.; Chang, T.; Chen, Y.-W.; Dias, N.; Hafez, W.; Ingerly, D.; Jang, M.; Karl, E.; Shi, S. K.-Y.; Komeyli, K.; Kilambi, H.; Kumar, A.; Byon, K.; Lee, C.-G.; Lee, J.; Leo, T.; Liu, P.-C.; Nidhi, N.; Olac-vaw, R.; Petersburg, C.; Phoa, K.; Prasad, C.; Quincy, C.; Ramaswamy, R.; Rana, T.; Rockford, L.; Subramaniam, A.; Tsai, C.; Vandervoorn, P.; Yang, L.; Zainuddin, A.; Bai, P.
2015 Symposium on VLSI Circuits (VLSI Circuits) VLSI Circuits (VLSI Circuits), 2015 Symposium on. :T12-T13 Jun, 2015
Conference
Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) VLSI test symposium VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE. :367-372 2002
Conference
Jan, C.-H.; Agostinelli, M.; Buehler, M.; Chen, Z.-P.; Choi, S.-J.; Curello, G.; Deshpande, H.; Gannavaram, S.; Hafez, W.; Jalan, U.; Kang, M.; Kolar, P.; Komeyli, K.; Landau, B.; Lake, A.; Lazo, N.; Lee, S.-H.; Leo, T.; Lin, J.; Lindert, N.; Ma, S.; McGill, L.; Meining, C.; Paliwal, A.; Park, J.; Phoa, K.; Post, I.; Pradhan, N.; Prince, M.; Rahman, A.; Rizk, J.; Rockford, L.; Sacks, G.; Schmitz, A.; Tashiro, H.; Tsai, C.; Vandervoorn, P.; Xu, J.; Yang, L.; Yeh, J.-Y.; Yip, J.; Zhang, K.; Zhang, Y.; Bai, P.
2009 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2009 IEEE International. :1-4 Dec, 2009
Conference
Jan, C.-H.; Bai, P.; Biswas, S.; Buehler, M.; Chen, Z.-P.; Curello, G.; Gannavaram, S.; Hafez, W.; He, J.; Hicks, J.; Jalan, U.; Lazo, N.; Lin, J.; Lindert, N.; Litteken, C.; Jones, M.; Kang, M.; Komeyli, K.; Mezhiba, A.; Naskar, S.; Olson, S.; Park, J.; Parker, R.; Pei, L.; Post, I.; Pradhan, N.; Prasad, C.; Prince, M.; Rizk, J.; Sacks, G.; Tashiro, H.; Towner, D.; Tsai, C.; Wang, Y.; Yang, L.; Yeh, J.-Y.; Yip, J.; Mistry, K.
2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008
Conference
Post, I.; Akbar, M.; Curello, G.; Gannavaram, S.; Hafez, W.; Jalan, U.; Komeyli, K.; Lin, J.; Lindert, N.; Park, J.; Rizk, J.; Sacks, G.; Tsai, C.; Yeh, D.; Bai, P.; Jan, C.-H.
2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-3 Dec, 2006
Conference
IEEE 1991 International Conference on Systems Engineering Systems Engineering, 1991., IEEE International Conference on. :49-56 1991
Conference
In: IEEE International Reliability Physics Symposium Proceedings , 2023 IEEE International Reliability Physics Symposium, IRPS 2023 - Proceedings. (IEEE International Reliability Physics Symposium Proceedings, 2023, 2023-March)
Conference
VanDerVoorn, P.; Agostinelli, M.; Choi, S.-J.; Curello, G.; Deshpande, H.; El-Tanani, M. A.; Hafez, W.; Jalan, U.; Janbay, L.; Kang, M.; Koh, K.-J.; Komeyli, K.; Lakdawala, H.; Lin, J.; Lindert, N.; Mudanai, S.; Park, J.; Phoa, K.; Rahman, A.; Rizk, J.; Rockford, L.; Sacks, G.; Soumyanath, K.; Tashiro, H.; Taylor, S.; Tsai, C.; Xu, H.; Xu, J.; Yang, L.; Young, I.; Yeh, J.-Y.; Yip, J.; Bai, P.; Jan, C.-H.
2010 Symposium on VLSI Technology VLSI Technology (VLSIT), 2010 Symposium on. :137-138 Jun, 2010
Conference
Jan, C.-H.; Bhattacharya, U.; Brain, R.; Choi, S.-J.; Curello, G.; Gupta, G.; Hafez, W.; Jang, M.; Kang, M.; Komeyli, K.; Leo, T.; Nidhi, N.; Pan, L.; Park, J.; Phoa, K.; Rahman, A.; Staus, C.; Tashiro, H.; Tsai, C.; Vandervoorn, P.; Yang, L.; Yeh, J.-Y.; Bai, P.
2012 International Electron Devices Meeting Electron Devices Meeting (IEDM), 2012 IEEE International. :3.1.1-3.1.4 Dec, 2012
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제한된 항목
[AR] Komeyli, K.
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