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ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.01EX483) Electronics, circuits and systems Electronics, Circuits and Systems, 2001. ICECS 2001. The 8th IEEE International Conference on. 2:933-936 vol.2 2001
Conference
Craig, M.; Deshazo, D.; Prior, S.; Tranchina, B.; Erhart, M.; Mahant-Shetti, S.S.; Taylor, R.; Xing, Y.; Quek, E.; Chok, K.L.; Kamat, N.; Redford, M.
2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 2000 (Cat. No.00CH37072) Advanced semiconductor manufacturing Advanced Semiconductor Manufacturing Conference and Workshop, 2000 IEEE/SEMI. :89-91 2000
Academic Journal
Ross, M.T.; Grafham, D.V.; Coffey, A.J.; McLay, K.; Howell, G.R.; Burrows, C.; Bird, C.P.; Prankish, A.; Lovell, F.L.; Howe, K.L.; Ashurst, J.L.; Jones, M.C.; Hurles, M.E.; Andrews, T.D.; Scott, C.E.; Searle, S.; Whittaker, A.; Deadman, R.; Carter, N.P.; Hunt, S.E.; Alnscough, R.; Ambrose, K.D.; Ashwell, R.I.S.; Babbage, A.K.; Bagguley, C.L.; Banerjee, R.; Barker, G.E.; Barlow, K.F.; Barrett, I.P.; Bates, K.N.; Beare, D.M.; Beasley, H.; Beasley, O.; Bethel, G.; Brady, N.; Bray-Allen, S.; Bridgeman, A.M.; Brown, A.J.; Burford, D.; Burgess, J.; Burrill, W.; Burton, J.; Bye, J.M.; Carder, C.; Chapman, J.C.; Clark, S.Y.; Clarke, G.; Clee, C.M.; Clegg, S.; Clifford, K.; Cobley, V.; Cole, C.G.; Conquer, J.S.; Corby, N.; Connor, R.E.; Davies, J.; Davis, J.; Dhami, P.; Dodsworth, S.; Dunham, A.; Dunn, M.; Dutta, I.; Eades, T.; Ellwood, M.; Errington, H.; Faulkner, L.; Frankland, J.; Fraser, A.E.; Gilbert, J.; Gregory, S.G.; Gribble, S.; Griffiths, C.; Grocock, R.; Gwilliam, R.; Hart, E.A.; Heath, P.D.; Ho, S.; Hoffs, M.; Howden, P.J.; Huckle, E.J.; Hunt, P.J.; Hunt, A.R.; Isherwood, J.; Johnson, D.; Joseph, S.S.; Keenan, S.; Kershaw, J.K.; Knights, A.J.; Laird, G.K.; Langford, C.; Lawlor, S.; Leversha, M.; Lloyd, C.; Lloyd, D.M.; Loveland, J.E.; Lovell, J.D.; Lyne, R.; Matthews, L.H.; McDowall, J.; McLaren, S.; McMurray, A.; Meidl, P.; Milne, S.; Mistry, S.L.; O'Dell, C.N.; Palmer, S.; Pandian, R.; Patel, D.; Pearce, A.V.; Pearson, D.M.; Pelan, S.E.; Porter, K.M.; Ramsey, Y.; Rhodes, S.; Ridler, K.A.; Sehra, H.K.; Shaw-Smith, C.; Sheridan, E.M.; Shownkeen, R.; Skuce, C.D.; Smith, M.L.; Sotheran, E.C.; Steingruber, H.E.; Steward, C.A.; Storey, R.; Swann, R.M.; Swarbreck, D.; Thomas, K.; Thorpe, A.; Tracey, A.; Trevanion, S.; Tromans, A.C.; Wall, M.; Warry, G.L.; West, A.; Whitehead, S.L.; Whiteley, M.N.; Wilkinson, J.E.; Willey, D.L.; Williams, L.; Williamson, H.; Wilming, L.; Woodmansey, R.L.; Wray, P.W.; Buck, D.; Rice, C.M.; Vaudin, M.; Coulson, A.; Sulston, J.E.; Durbin, R.; Hubbard, T.; Beck, S.; Rogers, J.; Bentley, D.R.; Scherer, S.; Muzny, D.; Chen, R.; Cree, A.; Gunaratne, P.; Havlak, P.; Hodgson, A.; Metzker, M.L.; Richards, S.; Scott, G.; Steffen, D.; Sodergren, E.; Wheeler, D.A.; Worley, K.C.; Ansari-Lari, M.A.; Aradhya, S.; Ballabio, A.; Brown, M.J.; Bonnin, D.; Buhay, C.; Burch, P.; Chako, J.; Chavez, D.; Chen, G.; Chen, Z.; Chinault, C.; Clerc-Blankenburg, K.; David, R.; Davis, C.; Delgado, O.; DeShazo, D.; Ding, Y.; Dinh, H.; Draper, H.; Dugan-Rocha, S.; Durbin, K.J.; Emery-Cohen, A.; Gill, R.; Gu, Y.; Hamilton, C.; Hawes, A.; Hernandez, J.; Hume, J.; Jacob, L.; Jones, S.; Kelly, S.; Khan, Z.; Kovar-Smith, C.; Lewis, L.; Liu, W.; Loulseged, H.; Lozado, R.; Lu, J.; Ma, J.; Maheshwari, M.; Miner, G.; Morgan, M.; Morris, S.; Nguyen, N.; Okwuonu, G.; Parker, D.; Parrish, J.; Pasternak, S.; Perez, L.; Shen, H.; Tabor, P.E.; Taylor, T.; Teague, B.; Timms, K.; Verduzco, D.; Villasana, D.; Waldron, L.; Wang, Q.; Warren, J.; Wei, X.; Williams, G.; Williamson, A.; Yen, J.; Zhang, J.; Zhou, J.; Zoghbi, H.; Zorilla, S.; Nelson, D.L.; Weinstock, G.; Gibbs, R.A.; Platzer, M.; Wen, G.; Blechschmidt, K.; Galgoczy, P.; Glöckner, G.; Hinzmann, B.; Nordsiek, G.; Nyakatura, G.; Reichwald, K.; Taudien, S.; Rosenthal, A.; Fulton, R.S.; Minx, P.J.; Hillier, L.W.; Wilson, R.K.; Waterston, R.H.; Sudbrak, R.; Beck, A.; Heitmann, K.; Hennig, S.; Klages, S.; Kosiura, A.; Müller, I.; Reinhardt, R.; Lehrach, H.; Ramser, J.; Meindl, A.; Bruford, E.A.; Carrel, L.; Chen, E.; Chen, Y.; Ciccodicola, A.; D'Urso, M.; Evans, K.L.; Francis, F.; De Jong, P.J.; Kloschis, P.; Poustka, A.; Meitinger, T.; Mullikin, J.C.; Schueler, M.G.; Schlessinger, D.; Willard, H.F.
In: Nature . (Nature, 17 March 2005, 434(7031):325-337)
Conference
In: Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems , ICECS 2001 - 8th IEEE International Conference on Electronics, Circuits and Systems. (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, 2001, 2:933-936)
Conference
Craig, M.; Deshazo, D.; Prior, S.; Tranchina, B.; Erhart, M.; Mahant-Shetti, S.S.; Taylor, R.; Xing, Y.; Quek, E.; Chok, K.L.; Kamat, N.; Redford, M.
In: IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings . (IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings, 2000, :89-91)
Conference
ICECS 2001. 8th IEEE International Conference on Electronics, Circuits & Systems (Cat. No.01EX483); 2001, p933-933, 1p
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[AR] DeShazo, D.
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