학술논문
'학술논문'
에서 검색결과 143건 | 목록
1~10
Conference
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-7 Apr, 2024
Conference
Martemucci, M.; Rummens, F.; Hirtzlin, T.; Martin, S.; Guille, O.; Januel, T.; Carabasse, C.; Billoint, O.; Laguerre, J.; Coignus, J.; Vincent, A. F.; Querlioz, D.; Grenouillet, L.; Saighi, S.; Vianello, E.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Academic Journal
Barbot, J.; Fontanini, R.; Segatto, M.; Coignus, J.; Triozon, F.; Carabasse, C.; Bedjaoui, M.; Andrieu, F.; Esseni, D.; Grenouillet, L.
Conference
Laguerre, J.; Bocquet, M.; Billoint, O.; Martin, S.; Coignus, J.; Carabasse, C.; Magis, T.; Dewolf, T.; Andrieu, F.; Grenouillet, L.
2023 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2023 IEEE International. :1-4 May, 2023
Conference
Grenouillet, L.; Barbot, J.; Laguerre, J.; Martin, S.; Carabasse, C.; Louro, M.; Bedjaoui, M.; Minoret, S.; Kerdiles, S.; Boixaderas, C.; Magis, T.; Jahan, C.; Andrieu, F.; Coignus, J.
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-8 Mar, 2023
Conference
Alcala, R.; Materano, M.; Lomenzo, P.D.; Grenouillet, L.; Francois, T.; Coignus, J.; Vaxelaire, N.; Carabasse, C.; Chevalliez, S.; Andrieu, F.; Mikolajick, T.; Schroeder, U.
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2022 6th IEEE. :67-69 Mar, 2022
Conference
Fontanini, R.; Barbot, J.; Segatto, M.; Lancaster, S.; Duong, Q.; Driussi, F.; Grenouillet, L.; Triozon, F.; Coignus, J.; Mikolajick, T.; Slesazeck, S.; Esseni, D.
ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2021 - IEEE 51st European. :255-258 Sep, 2021
Academic Journal
Francois, T.; Coignus, J.; Makosiej, A.; Giraud, B.; Carabasse, C.; Barbot, J.; Martin, S.; Castellani, N.; Magis, T.; Grampeix, H.; Van Duijn, S.; Mounet, C.; Chiquet, P.; Schroeder, U.; Slesazeck, S.; Mikolajick, T.; Nowak, E.; Bocquet, M.; Barrett, N.; Andrieu, F.; Grenouillet, L.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(4):2108-2114 Apr, 2022
Academic Journal
Fontanini, R.; Barbot, J.; Segatto, M.; Lancaster, S.; Duong, Q.; Driussi, F.; Grenouillet, L.; Triozon, L.; Coignus, J.; Mikolajick, T.; Slesazeck, S.; Esseni, D.
IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 10:593-599 2022
Conference
Viey, A.G.; Vandendaele, W.; Jaud, M.-A.; Coignus, J.; Cluzel, J.; Krakovinsky, A.; Martin, S.; Biscarrat, J.; Gwoziecki, R.; Sousa, V.; Gaillard, F.; Modica, R.; Iucolano, F.; Meneghini, M.; Meneghesso, G.; Ghibaudo, G.
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-8 Mar, 2021
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[AR] Coignus, J.
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