학술논문
'학술논문'
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Active properties of carbon nanotube field-effect transistors deduced from S parameters measurements
Academic Journal
IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 5(4):335-342 Jul, 2006
Conference
2006 European Solid-State Device Research Conference Solid-State Device Research Conference, 2006. ESSDERC 2006. Proceeding of the 36th European. :206-209 Sep, 2006
Academic Journal
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 27(8):681-683 Aug, 2006
Academic Journal
Boudjelida, B.; Gee, I.; Evans-Freeman, J.; Clark, S. A.; Maffeis, T. G. G.; Teng, K. S.; Wilks, S.; Azize, M.; Bethoux, J.-M.; De Mierry, P.
Academic Journal
Academic Journal
Bethoux, J.-M.; Vennéguès, P.; Natali, F.; Feltin, F.; Tottereau, 0.; Nataf, G.; Mierry, P. De; Semond, F.
Book
Rouchier, S.; Gaudin, G.; Allibert, F.; Drouin, A.; Bethoux, J.-M.; Boulet, R.; Chapelle, A.; Cela, E.; Lavaitte, G.; Bouville-Lallart, A.; Viravaux, L.; Radu, I.; Maleville, C.; Schwarzenbach, W.; Widiez, J.; Rolland, E.; Vladimirova, K.; Gélineau, G.; Troutot, N.; Navone, C.; Servant, F.; Berre, G.; Bosch, D.; Leow, Y.L.; Duboust, A.; Bhargava, S.; Thomas, S.
In: Silicon Carbide and Related Materials 2021- Selected peer-reviewed extended papers abstracts of which were presented at the 13th European Conference on Silicon Carbide and Related Materials, ECSCRM 2021 . (Materials Science Forum, 2022, 1062 MSF:131-135)
Conference
Daval, N.; Drouin, A.; Biard, H.; Viravaux, L.; Radisson, D.; Rouchier, S.; Gaudin, G.; Allibert, F.; Bethoux, J.-M.; Boulet, R.; Chapelle, A.; Cela, E.; Lavaitte, G.; Bouville-Lallart, A.; Schwarzenbach, W.; Maddalon, C.; Radu, I.; Odoul, S.; Delprat, D.; Bonnin, O.; Maleville, C.; Widiez, J.; Rolland, E.; Vladimirova, K.; Gelineau, G.; Troutot, N.; Navone, C.; Berre, G.; Bosch, D.; Leow, Y.L.; Duboust, A.; Bhargava, S.
In: 6th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2022 , 6th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2022. (6th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2022, 2022, :85-87)
Conference
Bertrand, I.; Flatresse, P.; Besnard, G.; Bethoux, J.-M.; Allibert, F.; Chalupa, Z.; Plantier, C.; Rack, M.; Nabet, M.; Raskin, J.-P.
In: ECS Transactions . (ECS Transactions, 2022, 108(5):31-45)
Conference
Guiot, E.; Picun, G.; Allibert, F.; Schwarzenbach, W.; Drouin, A.; Béthoux, J.-M.; Rouchier, S.; Widiez, J.; Leib, J.; Becker, T.; Erlbacher, T.
In: PCIM Europe Conference Proceedings , PCIM Europe 2022. (PCIM Europe Conference Proceedings, 2022, :591-597)
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[AR] Bethoux, J.-M.
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