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In Microelectronics Reliability November 2023 150
Academic Journal
In: Southeastern Geographer . (Southeastern Geographer, Fall 2023, 63(3):219-225)
Conference
Sell, B.; An, S.; Armstrong, J.; Bahr, D.; Bains, B.; Bambery, R.; Bang, K.; Basu, D.; Bendapudi, S.; Bergstrom, D.; Bhandavat, R.; Bhowmick, S.; Buehler, M.; Caselli, D.; Cekli, S.; Chaganti, Vrsk.; Chang, Y. J.; Chikkadi, K.; Chu, T.; Crimmins, T.; Darby, G.; Ege, C.; Elfick, P.; Elko-Hansen, T.; Fang, S.; Gaddam, C.; Ghoneim, M.; Gomez, H.; Govindaraju, S.; Guo, Z.; Hafez, W.; Haran, M.; Hattendorf, M.; Hu, S.; Jain, A.; Jaloviar, S.; Jang, M.; Kameswaran, J.; Kapinus, V.; Kennedy, A.; Klopcic, S.; Krishnan, D.; Leib, J.; Lin, Y.-T.; Lindert, N.; Liu, G.; Loh, O.; Luo, Y.; Mani, S.; Mleczko, M.; Mocherla, S.; Packan, P.; Paik, M.; Paliwal, A.; Pandey, R.; Patankar, K.; Pipes, L.; Plekhanov, P.; Prasad, C.; Prince, M.; Ramalingam, G.; Ramaswamy, R.; Riley, J.; Perez, J. R. Sanchez; Sandford, J.; Sathe, A.; Shah, F.; Shim, H.; Subramanian, S.; Tandon, S.; Tanniru, M.; Thakurta, D.; Troeger, T.; Wang, X.; Ward, C.; Welsh, A.; Wickramaratne, S.; Wnuk, J.; Xu, S. Q.; Yashar, P.; Yaung, J.; Yoon, K.; Young, N.
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :282-283 Jun, 2022
Academic Journal
In Procedia Chemistry September 2009 1(1):1527-1530
Academic Journal
In Procedia Chemistry September 2009 1(1):76-79
Academic Journal
Curran, B.; Reyes, J.; Tschoban, C.; Hofer, J.; Grams, A.; Wust, F.; Hutter, M.; Leib, J.; Martinez-Vazquez, M.; Baggen, R.; Ndip, I.; Lang, K.
IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manufact. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 8(7):1231-1240 Jul, 2018
Academic Journal
Vourloumis, D.; Mavridis, I.; Athanasoulis, A.; Temponeras, I.; Koumantou, D.; Mpakali, A.; Stratikos, E.; Papakyriakou, A.; Giastas, P.; Magrioti, V.; Leib, J.; Van Endert, P.
In: Journal of Medicinal Chemistry . (Journal of Medicinal Chemistry, 28 July 2022, 65(14):10098-10117)
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[AR] Leib, J.
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